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A method and related device for analyzing dielectric breakdown characteristics under impulse voltage

A technology of impulse voltage and dielectric breakdown, which is applied in the direction of measuring devices, measuring electricity, and measuring electrical variables, etc., can solve the problems of not being able to fully characterize the breakdown characteristics, and achieve a comprehensive effect of characterization

Active Publication Date: 2021-09-17
ELECTRIC POWER RES INST OF GUANGDONG POWER GRID
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  • Application Information

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Problems solved by technology

[0004] This application provides a dielectric breakdown characteristics analysis method under impulse voltage and related devices, which are used to solve the technical problem that the existing analysis methods of dielectric breakdown characteristics under impulse voltage cannot fully characterize the breakdown characteristics

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  • A method and related device for analyzing dielectric breakdown characteristics under impulse voltage
  • A method and related device for analyzing dielectric breakdown characteristics under impulse voltage
  • A method and related device for analyzing dielectric breakdown characteristics under impulse voltage

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Embodiment Construction

[0036] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiment of the application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiment of the application. Obviously, the described embodiment is only It is a part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0037] For ease of understanding, see figure 1 , the present application provides an embodiment of a method for analyzing dielectric breakdown characteristics under impulse voltage, including:

[0038] Step 101 , applying an impulse voltage signal to the insulating medium, and performing a preset number of breakdown tests on the insulating medium under the same te...

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Abstract

This application discloses a method for analyzing dielectric breakdown characteristics under impulse voltage and related devices. The breakdown energy loss is calculated by using the breakdown voltage, current and breakdown duration when the impulse voltage breaks down, and the starting time of breakdown is taken as On the horizontal axis, the breakdown energy loss is plotted on the vertical axis to generate the breakdown energy distribution curve under the impulse voltage. By analyzing the breakdown energy distribution curve, the analysis results of the dielectric breakdown characteristics are obtained, and the breakdown voltage, breakdown current and The factor of the breakdown duration makes the characterization of the dielectric breakdown characteristics under the impulse voltage more comprehensive, and solves the technical problem that the existing analysis method of the dielectric breakdown characteristics under the impulse voltage cannot fully characterize the breakdown characteristics.

Description

[0001] This application claims the priority of the Chinese patent application with the filing date on December 27, 2019 and the application number 201911380624.X. technical field [0002] The present application relates to the technical field of electrical testing, in particular to a method for analyzing dielectric breakdown characteristics under impulse voltage and related devices. Background technique [0003] The dielectric breakdown characteristics play an important role in judging whether there is a breakdown in the tested equipment. At present, the methods for analyzing the breakdown characteristics of the dielectric under the impact voltage mainly use 50% breakdown voltage, volt-second characteristic curve and breakdown probability curve. and other methods to test. However, these existing breakdown characteristics analysis methods are all analyzed from the perspective of voltage. However, in fact, the breakdown process of the medium under the impulse voltage is not on...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/12
CPCG01R31/1263
Inventor 孙文星蔡玲珑杨贤马志钦靳宇晖饶章权欧阳旭东林春耀周丹江丹宇
Owner ELECTRIC POWER RES INST OF GUANGDONG POWER GRID