A kind of test method and test system of earphone

Abstract

The invention discloses a test method and a test system for an earphone. The method includes 1) setting the test sequence of test items on the test system in advance; 2) setting the upper limit value, center value and lower limit of each test item on the test system in advance 3) Place the earphone to be tested on the test fixture matching the earphone to be tested, and make the earphone to be tested communicate with the test system, and perform the test according to the above preset test sequence to obtain the test data; 4) The test system judges the test Whether the project needs to modify the preset sequence, if so, the test system modifies the test sequence, and then returns to step 2), if not, the test system saves the test data of each test item as a log file; the test system includes a process setting module, value setting Module, Master Module, Marker Module, Process Adjustment Module and Save Module. The invention can test the test items that are easy to fail in advance, reduce unnecessary time waste, and effectively improve the earphone test efficiency.

Description

technical field [0001] The invention relates to the technical field of earphones, in particular to an earphone testing method and a testing system. Background technique [0002] With the improvement of living standards, people's requirements for music are getting higher and higher. In noisy environments, people also want to have an ultimate music experience. Noise-cancelling headphones have gradually entered people's lives. Active noise reduction headphones rely on feedforward microphones, feedback microphones, speakers, cavities, earmuffs, algorithms, etc. to isolate and offset external noise. [0003] A good performance noise-canceling earphone is also inseparable from strict testing, because active noise-canceling earphones need to test a variety of items, including: feed-forward microphone sensitivity, feedback microphone sensitivity, speaker frequency response, feed-forward microphone gain, feedback microphone Gain, EQ, eartip seal, and more. The test takes too long, ...

AI Technical Summary

Problems solved by technology

The test takes too long, which brings great challenges to the test method. At present, the test sequence of the above test items is generally preset in the test system. If the test fails in the second half of the test or when the test is about to be completed, it will waste work A lot of time for personnel, reducing production efficiency

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