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Test data acquisition method and device, electronic equipment and medium

A technology for testing data and acquiring methods, applied in the field of data processing, can solve problems such as errors, affecting test efficiency, and data unsuitable for testing

Pending Publication Date: 2020-09-11
PING AN BANK CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, some data related to the test task is usually selected artificially. However, when the data related to the test task is artificially selected, mistakes are often made, resulting in the selected data not suitable for the test of the existing system. Selecting data in huge and complex data affects test efficiency

Method used

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  • Test data acquisition method and device, electronic equipment and medium
  • Test data acquisition method and device, electronic equipment and medium
  • Test data acquisition method and device, electronic equipment and medium

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Embodiment Construction

[0096] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0097] Such as figure 1 Shown is a flow chart of a preferred embodiment of the test data acquisition method of the present invention. According to different requirements, the order of the steps in the flowchart can be changed, and some steps can be omitted.

[0098] The test data acquisition method is applied in the smart government affairs scene, thereby promoting the construction of a smart city. The test data acquisition method is applied to one or more electronic devices, and the electronic device is a device that can automatically perform numerical calculation and / or information processing according to preset or stored instructions, and its hardware includes but not Limited to microprocessors, application specific integrated circuits (Appli...

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Abstract

The invention relates to data processing, and provides a test data acquisition method and device, electronic equipment and a medium. The method comprises the steps of determining a to-be-tested systemand obtaining a logic instruction; the method comprises the steps of determining a to-be-tested function point according to a to-be-tested system, determining a data source according to the to-be-tested function point, obtaining data suitable for testing the to-be-tested function point by determining the to-be-tested function point, obtaining a data table from the data source, determining an association table associated with the data table, obtaining a first field of the data table, and obtaining a second field of the association table; splicing the first field and the second field accordingto the logic instruction, the query instruction is generated, non-test professionals can accurately obtain the data related to the test task by generating the query instruction, the test data is obtained through the query instruction, and the test data can be obtained without manual work from numerous and numerous data, so that the obtaining efficiency of the test data can be improved. In addition, the invention also relates to a blockchain technology, and the target data is stored in the blockchain.

Description

technical field [0001] The present invention relates to the technical field of data processing, in particular to a test data acquisition method, device, electronic equipment and medium. Background technique [0002] With the development of computer technology, various software systems have emerged. Existing software systems need to obtain test data from external systems for testing when developing and testing. In order to complete this test task, it is necessary to obtain relevant test data from the huge and complex data, and then input it into the software system for testing. At present, some data related to the test task is usually selected artificially. However, when the data related to the test task is artificially selected, mistakes are often made, resulting in the selected data not suitable for the test of the existing system. Selecting data from complex data affects test efficiency. Contents of the invention [0003] In view of the above, it is necessary to provid...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06F16/22G06F16/242G06F16/27
CPCG06F11/3668G06F16/2282G06F16/242G06F16/27Y02D10/00
Inventor 郭庆
Owner PING AN BANK CO LTD
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