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Main-sub clamp combined mechanism for defect detection of large-aperture optical element

A technology for optical components and defect detection, which is applied in the field of optical detection, can solve problems such as difficulty in obtaining a good guarantee of machining accuracy, and achieve the effects of ensuring repeatability, convenient operation, and easy realization

Pending Publication Date: 2020-09-29
HEFEI ZHICHANG PHOTOELECTRIC TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In the field of detection of large-diameter optical components, since the outer contour and thickness of optical components are generally large and heavy, the size of the supporting fixture mechanism is larger, and the machining accuracy of the larger mechanism components is often harder to get better guarantees

Method used

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  • Main-sub clamp combined mechanism for defect detection of large-aperture optical element
  • Main-sub clamp combined mechanism for defect detection of large-aperture optical element
  • Main-sub clamp combined mechanism for defect detection of large-aperture optical element

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Embodiment Construction

[0028] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0029] A sub-mother fixture combination mechanism for defect detection of large-diameter optical components, including a mother fixture and a sub-fixture;

[0030] See figure 1 and figure 2, the female fixture includes a female fixture positioning plate 11 and a female fixture positioning clamping ring 12; the female fixture positioning plate 11 is provided with a hollow inner ring structure, and the hollow inner ring structure includes a central circular ho...

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Abstract

The invention discloses a main-sub clamp combined mechanism for defect detection of a large-aperture optical element. The main-sub clamp combined mechanism comprises a main clamp and a sub-clamp. According to the main-sub clamp combined mechanism for defect detection of the large-aperture optical element, the sub-clamp can be designed in a customized mode according to the aperture size of the optical element and is suitable for clamping optical elements with various thickness sizes, the optical element can be automatically pressed in the process of clamping the large-aperture optical element by the sub-clamp, and circumferential positioning is achieved, so that operation is convenient; according to the main-sub clamp combined mechanism for defect detection of the large-aperture optical element, after the large-aperture optical element is clamped, the inner end faces of four arc-shaped plates of a sub-clamp positioning plate make close contact with the inner end face of a main clamp positioning plate, the contact fit degree is only affected by the machining precision of the planeness of the inner end faces of the arc-shaped plates of the sub-clamp and the machining precision of theplaneness of the inner end face of the main clamp positioning plate, and a machining method is easier to implement; and according to the main-sub clamp combined mechanism for defect detection of the large-aperture optical element, after the large-aperture optical element is clamped, the large-aperture optical element is stably assembled on the main-sub clamp combined mechanism, so that the repeatability of an optical detection result is ensured.

Description

technical field [0001] The invention relates to the field of optical detection, in particular to a combination mechanism of a sub-mother fixture for defect detection of large-diameter optical elements. Background technique [0002] For an optical system with a fixed focal plane, when testing optical components, it is required that the surface to be tested coincides with the focal plane of the optical system to ensure the accuracy and repeatability of optical testing. The fixture supporting the optical system needs to position the tested surface of the optical element clamped on it so that it coincides with the focal plane of the optical system. In addition, due to the caliber and thickness of the optical element, there are often various sizes and specifications. There is also a need to be able to accommodate changes in optical component size specifications. For optical testing instruments and equipment, the operation and use of fixtures are also required to be simple and co...

Claims

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Application Information

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IPC IPC(8): B25B11/00
CPCB25B11/00
Inventor 王曦陈坚赵建华吴周令
Owner HEFEI ZHICHANG PHOTOELECTRIC TECH
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