Initialization parameter determination method and device of quantum measurement and control system and medium
A technology for initializing parameters and measurement and control systems, which is applied in the computer field and can solve problems such as difficulty in determining the initialization parameters of quantum measurement and control systems.
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[0052] In order to make the purpose, technical solution and advantages of the present application clearer, the technical solution of the present application will be clearly and completely described below in conjunction with specific embodiments of the present application and corresponding drawings. Apparently, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.
[0053] The technical solutions provided by various embodiments of the present application will be described in detail below in conjunction with the accompanying drawings.
[0054] figure 1 The flow diagram of a method for determining the initialization parameters of a quantum measurement and control system provided in Embodiment 1 of this specificati...
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