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Abnormal data determination method and device

A technology of abnormal data and determination method, applied in the field of computer

Pending Publication Date: 2020-10-16
BEIJING BAIDU NETCOM SCI & TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Existing outlier detection is mainly for time series arrays or other data without space restrictions

Method used

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  • Abnormal data determination method and device
  • Abnormal data determination method and device
  • Abnormal data determination method and device

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Embodiment Construction

[0019] Exemplary embodiments of the present application are described below in conjunction with the accompanying drawings, which include various details of the embodiments of the present application to facilitate understanding, and they should be regarded as exemplary only. Accordingly, those of ordinary skill in the art will recognize that various changes and modifications of the embodiments described herein can be made without departing from the scope and spirit of the application. Also, descriptions of well-known functions and constructions are omitted in the following description for clarity and conciseness.

[0020] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and embodiments.

[0021] figure 1 A schematic diagram 100 of a first embodiment of a method ...

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Abstract

The invention discloses an abnormal data determination method and device, and relates to the field of deep learning technology, big data and cloud computing. The method comprises the steps of obtaining a first space array of each time point; inputting the first space arrays of all time points into a data processing model; generating a second space array of each time point corresponding to the first space array of each time point, wherein the data processing model is used for representing spatial correlation of space data in the first space array based on each time point; screening the space data in the first space array of each time point according to the time sequence relationship of the space data in the first space array of all time points and the relevance of the space data in the first space array of different time points of all time points; and determining abnormal data corresponding to the first space array of each time point according to a comparison result of the first space array of each time point and the second space array of the corresponding time point. According to the scheme, the abnormal data can be accurately and quickly detected.

Description

technical field [0001] The embodiments of the present application relate to the field of computer technology, specifically to the field of deep learning, big data, and cloud computing technology, and especially to methods and devices for determining abnormal data. Background technique [0002] With the popularity of Internet of Things devices, satellite positioning system GPS devices, and smart phones, time series arrays and spatial location data are becoming more and more common and more relevant to people's lives. However, due to problems such as equipment failure, communication errors, and equipment accuracy, real spatial data often contain many outliers. These outliers have a serious impact on subsequent applications (such as statistical analysis, classification, model prediction, etc.). [0003] Existing outlier detection is mainly for time series arrays or other data without space constraints. For outlier detection of time series arrays, the mainstream method is to e...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F16/2458G06N3/04G06N3/08
CPCG06F16/2465G06N3/08G06N3/045
Inventor 马海雷孟泉
Owner BEIJING BAIDU NETCOM SCI & TECH CO LTD