Test fixture and test device

Abstract

The invention relates to the technical field of electronic product detection, and discloses a test fixture and a test device. The test fixture comprises a substrate, a limiting plate assembly, a firstchuck, a second chuck and a driving assembly, wherein the substrate is used for fixing a test probe group; the limiting plate assembly is movably connected with the base plate and used for supportingand limiting the position of the workpiece. The first chuck is movably connected with the base plate and can slide on the limiting plate assembly in the first horizontal direction so as to press thefirst connector on the limiting plate assembly; the second chuck is movably connected with the base plate and can slide on the limiting plate assembly in the second horizontal direction so as to pressthe second connector on the limiting plate assembly; the driving assembly can drive the limiting plate assembly to move in the vertical direction, and meanwhile the first chuck and the second chuck are made to press the two connectors respectively. The test fixture has the advantages of fast clamping and fixing rhythm of the workpiece, simple structure and low cost. The testing device can improvethe testing efficiency by arranging the testing clamp, and is simple in structure and low in cost.

Description

technical field [0001] The invention relates to the technical field of electronic product detection, in particular to a test fixture and a test device. Background technique [0002] An electronic product usually includes one or more connectors, and the connector contains multiple test pins, which are used to realize the connection between the integrated circuit board inside the electronic product and the external test socket. Connectors need to be tested before leaving the factory to evaluate the performance and quality of electronic products. [0003] In the prior art, a test device usually includes a test fixture and a test probe, the test fixture is used to support and position the product to be tested, and the test probe is used to electrically connect with the pin of the connector for testing. During the test, when the probe is in contact with the pin of the connector, it will exert a certain pressure on the pin. Therefore, in order to ensure the reliability of the con...

AI Technical Summary

Problems solved by technology

The above-mentioned test device, on the one hand, during the test process, the connector positioning, clamping action, and Pin contact action are carried out sequentially, the entire test process is slow, and the test efficiency is low; on the other hand, if a product includes two connectors, in order to ensure The accuracy of the test requires that the two connectors be clamped separately. Then, the test fixture needs to be provided with two driving sources for the clamping action and the driving source for the probe movement, resulting in a complex structure and high cost of the entire test fixture.

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