Signal recovery method for incoherent sampling and harmonic distortion in ADC frequency spectrum testing

Abstract

The invention discloses a signal recovery method for incoherent sampling and harmonic distortion in ADC spectrum testing. Firstly, fundamental waves are estimated to obtain an amplitude estimation value and an initial phase estimation value; the incoherent sampling fundamental wave signal is reconstructed; after incoherent sampling fundamental wave signals are removed from output signals of a tested ADC, amplitudes and initial phases of harmonic components of all orders are estimated; the harmonic signal is reconstructed and the harmonic signal is removed from the output signal of the tested ADC; secondary estimation and reconstruction are performed on the fundamental wave part based on the residual signal; the harmonic part is subjected to secondary estimation and reconstruction, the fundamental wave signal and the harmonic signal under the coherent sampling condition are reconstructed according to the parameters obtained through secondary estimation, the non-coherent signal in the output signal of the tested ADC is replaced with the coherent signal, and the non-coherent sampling signal can be recovered to obtain a coherent sampling signal. By adopting the method and the device, the ADC can be subjected to accurate frequency spectrum test under the condition that incoherent sampling and harmonic distortion exist in the ADC sampling signal to be tested.

Description

technical field [0001] The invention belongs to the technical field of ADC spectrum testing, and more specifically relates to a signal recovery method for non-coherent sampling and harmonic distortion in ADC spectrum testing. Background technique [0002] Analogue-To-Digital Converter (ADC) is a tool for converting analog signals to digital signals. It is widely used in the signal acquisition of various systems. It is an important part of signal acquisition and digital signal processing systems. An important part of the circuit test system. For integrated circuit test systems, it is very important to ensure accurate measurement of ADC parameters. ADC parameters include static parameters and dynamic parameters, dynamic parameter measurement is also called spectrum parameter test. As the resolution of the ADC becomes higher and the sampling speed becomes faster, the difficulty and cost of testing the spectrum parameters of the ADC also increase. Nowadays, the ADC test not o...

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Problems solved by technology

[0010] The purpose of the present invention is to overcome the deficiencies in the prior art, provide a kind of signal recovery method that there is non-coherent sampling and harmonic distortion in ADC spectrum test, break the limitation of coherent sampling condition and harmonic distortion condition, to the measured ADC in non-coherent The sampling signal obtained under the conditions of coherent sampling and harmonic distortion is restored to obtain a coherent sampling signal, so that the ADC can also be accurately tested for the frequency spectrum in the case of non-coherent sampling and harmonic distortion of the ADC sampling signal under test

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