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A telescopic test probe with integrated calibration device

A kind of calibration device, telescopic technology, applied in the direction of measuring device, measuring device shell, measuring circuit, etc., can solve the problems of uneven force, probe damage, difficult handling, and damaged probe, so as to achieve convenient operation, improve test efficiency, Avoid the effect of damage

Active Publication Date: 2022-08-02
SUZHOU METABRAIN INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Such a long-term application will damage the probe, and the probe itself is small, it is not easy to handle, and uneven force will also accelerate the damage of the probe

Method used

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  • A telescopic test probe with integrated calibration device
  • A telescopic test probe with integrated calibration device
  • A telescopic test probe with integrated calibration device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0046] For the convenience of description, the coordinate system is now defined as figure 1 As shown, the left-right direction is the horizontal direction, the front-rear direction is the vertical direction, and the up-down direction is the vertical direction.

[0047] like figure 1 and Image 6 As shown, a telescopic test probe with an integrated calibration device includes a main casing 1, the section of the main casing 1 is a square structure, and the whole is a cylindrical structure with a front end closed and a rear end opening. The rear end of the main casing 1 is provided with a sealing plate 2 for closing the main casing 1 .

[0048] like Figure 7 As shown, the front end (that is, the closed end) of the main casing 1 is provided with two avoidance holes 11 penetrating the front side wall of the main casing 1 in the front-rear direction, and the two avoidance holes 11 are related to the The vertical symmetry planes of the main casing 1 are arranged symmetrically. ...

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Abstract

The invention discloses a telescopic test probe with an integrated calibration device, and relates to the technical field of testing equipment. The probe includes a main casing, the front end of the main casing is hinged with two sliding sleeves, a calibration positioning cylinder is arranged in the sliding sleeve, and a probe is arranged in the calibration positioning cylinder. The upper and lower sides of the calibration and positioning cylinder are respectively provided with upper and lower clamping plates for clamping the calibration and positioning cylinder in the main casing. The upper and lower clamping plates have the same structure, and Symmetrical arrangement. A pressing rod is arranged on the outer side of the upper clamping plate. The main casing is provided with a limit hole matched with the pressing rod. A first spring is arranged between the upper clamping plate and the lower clamping plate for hindering the relative movement of the upper clamping plate and the lower clamping plate. The probe not only saves the process of plugging and unplugging the traditional calibration device to avoid damage to the probe, but also protects the probe.

Description

technical field [0001] The invention relates to the technical field of testing equipment, in particular to a testing probe for testing high-speed signals of servers. Background technique [0002] It is generally believed that if the frequency of the digital logic circuit reaches or exceeds 45MHZ-50MHZ, and the circuit working above this frequency has accounted for a certain amount of the entire electronic system (for example, 1 / 3), it is called a high-speed circuit. High-speed signals are extremely important for servers, and the quality of signals needs to be tested in daily production to ensure the quality of servers. [0003] When testing the existing test equipment, the probes on the probe need to be calibrated first to ensure that the two probes are consistent. However, since the diameter of the jack used for accommodating the probe is larger than the diameter of the probe, the position of the probe in the jack cannot be accurately defined during the calibration, which ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/3167G01R1/067G01R1/04
CPCG01R31/3167G01R1/067G01R1/0408
Inventor 刘安阳
Owner SUZHOU METABRAIN INTELLIGENT TECH CO LTD
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