Accelerated degradation test statistical analysis method under multi-stress multi-failure mode dependent competition condition
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- NAT UNIV OF DEFENSE TECH
- Publication Date
- 2020-12-11
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of reliability engineering, and in particular relates to a statistical analysis method for accelerated degradation tests under multi-stress and multi-failure mode dependent competition conditions. Background technique
[0002] Under the constraints of time and cost, life prediction technology based on accelerated degradation test has become an inevitable requirement to analyze and solve the reliability of high-reliability and long-life products. However, products are usually subjected to various stresses during actual service, including working stress (such as mechanical load, current, voltage, etc.) and environmental stress (such as temperature, vibration, shock, etc.). Therefore, the traditional accelerated degradation test with a single stress cannot truly reflect the actual stress state of the product. Studying the statistical analysis method of the accelerated degradation test of the product under the c...