Accelerated degradation test statistical analysis method under multi-stress multi-failure mode dependent competition condition

An accelerated degradation test and failure mode technology, applied in manufacturing computing systems, design optimization/simulation, special data processing applications, etc., can solve problems such as increased degradation amount or degradation rate, increased degradation rate, increased degradation amount, etc., to achieve improved Effects of Product Lifetime and Reliability Assessment
CN112069697AActive Publication Date: 2020-12-11NAT UNIV OF DEFENSE TECH

Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
NAT UNIV OF DEFENSE TECH
Publication Date
2020-12-11

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Abstract

The invention provides an accelerated degradation test statistical analysis method under a multi-stress multi-failure mode dependent competition condition. The method comprises the following steps: acquiring multi-stress accelerated degradation test data of a product; selecting a proper distribution model and estimating distribution parameters; establishing a model between the degradation amount distribution parameter and time and estimating a model parameter; constructing a multi-stress acceleration model; modelling multi-failure-mode dependent competitive reliability; and solving unknown parameters of the model to obtain product reliability distribution. The coupling influence of multiple stresses on life characteristics and the dependency of a degradation process and a random impact process are considered, a reliability function under the N stress M failure mode dependency competition condition is established, and the gap in the related research field is filled; based on product degradation amount distribution and a multi-stress multi-failure-mode dependent competition reliability model, an analysis method of an N-stress M-failure-mode dependent competition accelerated degradation test is established systematically for the first time, engineering practice is better met, the service life of a product is prolonged, and the accuracy of reliability evaluation is improved.
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Description

technical field

[0001] The invention belongs to the technical field of reliability engineering, and in particular relates to a statistical analysis method for accelerated degradation tests under multi-stress and multi-failure mode dependent competition conditions. Background technique

[0002] Under the constraints of time and cost, life prediction technology based on accelerated degradation test has become an inevitable requirement to analyze and solve the reliability of high-reliability and long-life products. However, products are usually subjected to various stresses during actual service, including working stress (such as mechanical load, current, voltage, etc.) and environmental stress (such as temperature, vibration, shock, etc.). Therefore, the traditional accelerated degradation test with a single stress cannot truly reflect the actual stress state of the product. Studying the statistical analysis method of the accelerated degradation test of the product under the c...

Claims

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