Test case generation method, system and electronic device based on binary search iteration
A test case generation and test case technology, applied in software testing/debugging, error detection/correction, electrical digital data processing, etc., to achieve the effects of reducing test costs, improving generation efficiency, and high search efficiency
Active Publication Date: 2022-08-02
YANGTZE UNIVERSITY
View PDF6 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
After investigation, DRst is only used to assist some algorithms, and is not used to construct a new algorithm to solve ATCG-PC
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0030] The specific embodiments of the present invention will be described in further detail below with reference to the accompanying drawings and embodiments. The following examples are intended to illustrate the present invention, but not to limit the scope of the present invention.
[0031] figure 1 A flowchart of a method for generating test cases based on binary search iteration provided by the embodiment of the present invention, as shown in figure 1 As shown, the method includes: a. performing a static analysis on the program under test, and extracting the target path set and static structure information of the program under test; b. based on the extracted static structure information, performing a binary search iterative algorithm to generate new c. Drive the generated new test case to run the program under test, record and update the path coverage information; d. Determine whether the binary iteration algorithm has reached the algorithm termination condition, if the ...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
Embodiments of the present invention provide a method, system, and electronic device for generating test cases based on binary search iteration. The method includes: performing static analysis on a program under test, extracting target path sets and static structure information; based on the extracted static structure information , execute the binary search iterative algorithm to generate new test cases; drive the generated test cases to run the program under test, record and update the path coverage information; select the fitness from the test cases generated in the current iteration and the test cases retained in the previous iteration The optimal test case goes to the next round of iteration until the iterative algorithm satisfies the termination condition. The binary search iterative algorithm of the embodiment of the present invention makes full use of the potential relationship between paths, and quickly finds test cases of other paths by using existing test cases. Among them, the binary search has higher search efficiency, improves the test case generation efficiency for path coverage, and reduces the test cost.
Description
technical field [0001] The invention relates to the field of software testing, and more particularly, to a method, system and electronic device for generating test cases based on binary search iteration. Background technique [0002] Software testing is one of the important means to ensure software quality in the software development life cycle. Automated software testing (AST) is a promising method to improve the effectiveness and efficiency of software testing. A key factor affecting the efficiency of AST is generating test cases that satisfy selected coverage criteria, such as statement coverage, branch coverage, path coverage, etc. It turns out that statement or branch coverage problems can be transformed into path coverage problems. Therefore, finding a suitable path coverage-oriented automated test case (ATCG-PC) method is an important topic in AST. [0003] So far, research on ATCG-PC has achieved some success, and several prominent ATCG-PC techniques include symbol...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36G06F8/65
CPCG06F11/3676G06F11/3684G06F11/3688G06F8/65
Inventor 胡中波蔡高成吴海涛杨先山熊凯俊
Owner YANGTZE UNIVERSITY