Memory chip overclocking test module and method thereof

Abstract

The invention relates to a memory chip overclocking test module and a method thereof, which are applied to a two-stage memory chip test process, are used for screening memory chips with different speeds. The module comprise a test panel area, a positioning temporary storage panel, at least one pre-test machine table, a plurality of test machine tables and a mechanical arm; the mechanical arm is electrically connected with the test panel area, the positioning temporary storage disc, the pre-test machine table and the test machine table, the pre-test machine table is arranged between the positioning temporary storage disc and the test machine table and used for conducting first-stage testing and screening on memories, and complete memory chip testing is conducted on the test machine table through the memories screened by the first-stage pre-test machine table. Efficiency and accuracy are improved, and misjudgment is reduced.

Description

technical field [0001] The invention relates to a memory chip overclocking test module and its method, in particular to a preliminary screening of memory chips through a pre-test machine to achieve multi-speed classification. Background technique [0002] At present, with the rapid development of science and technology, various types of memory are also used in daily life in different forms to make various electronic devices have more functions and operability. For example, Random Access Memory (RAM), which is commonly used in personal computers (PCs), has the characteristics of reading and writing at any time and high speed, so it is often used as a storage medium for temporary data of operating systems or other programs that are being executed. It can be subdivided into dynamic random access memory (Dynamic Random Access Memory, DRAM) and static random access memory (Static Random Access Memory, SRAM). [0003] Moreover, the e-sports industry has grown rapidly in recent ye...

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Problems solved by technology

[0004] Traditionally, the memory manufacturing process and testing methods have used a lot of manpower to classify the speed of particles, and the screening must start from low speed. To detect overclocked memory, in order to avoid subsequent maintenance costs caused by machine failure, use A large amount of manpower also means a lot of time and management costs, and the fatigue and misjudgment caused by the eyesight and physical strength of the personnel will also increase. These are areas that need breakthroughs and improvements

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