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Test device, test module and control method

A technology of testing devices and control methods, which is applied in the direction of measuring devices, measuring device shells, electrical program control, etc., can solve the problem that multiple probes cannot maintain consistent pressure, and achieve the effect of consistent pressure

Pending Publication Date: 2021-03-02
江西德瑞光电技术有限责任公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] Aiming at the deficiencies of the prior art, the purpose of the present invention is to provide a testing device aimed at solving the technical problem in the prior art that multiple probes cannot maintain consistent pressure

Method used

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  • Test device, test module and control method
  • Test device, test module and control method
  • Test device, test module and control method

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Embodiment Construction

[0045] In order to make the purpose, features and advantages of the present invention more obvious and understandable, the specific implementation manners of the present invention will be described in detail below in conjunction with the accompanying drawings. Several embodiments of the invention are shown in the drawings. However, the present invention can be embodied in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that the disclosure of the present invention will be thorough and complete.

[0046] It should be noted that when an element is referred to as being “fixed on” another element, it may be directly on the other element or there may be an intervening element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or intervening elements may also be present. As used herein, the terms "vertical," "horizontal," "left," "right," "u...

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Abstract

The invention discloses a test device, a test module and a control method, and relates to the technical field of detection. The test device comprises a power supply probe and a detection probe, the test device also comprises: a shell, which is of a hollow structure to form a pressure cavity, wherein a medium is injected into the pressure cavity, and at least parts of the power supply probe and thedetection probe are located in the pressure cavity and are in contact with the medium; a piston, which is arranged in the pressure cavity and is in sliding contact with the inner wall of the shell; adriver, which is used for driving the piston to do reciprocating motion along the axial direction of the pressure cavity so as to drive the medium and promote the power supply probe and the detectionprobe to do reciprocating motion; a controller, which is electrically connected with the driver so as to control the driving stroke of the driver; and a pressure sensor, which is arranged on the shell, has at least part extending into the pressure cavity, and is electrically connected with the controller to feed back the pressure value in the pressure cavity. According to the invention, the technical problem that in the prior art a plurality of probes cannot keep consistent pressure all the time can be solved.

Description

technical field [0001] The invention relates to the technical field of semiconductor laser detection, in particular to a test device, a test module and a control method. Background technique [0002] At present, the commonly used semiconductor laser chip, bar or planar packaging device needs to be fixed by vacuum adsorption base during the inspection process, and the necessary test or reliability inspection is carried out by pressing the spring probe above the chip, bar or planar package device. . [0003] For example, the main test content for semiconductor lasers is the relationship between optical power-current (L-I) and voltage-current (V-I), so the commonly used detection probes are four-probe or multi-probe modules with springs inside. Needles include positive power supply probe, negative power supply probe, positive detection probe and negative detection probe, such as patent applications with application numbers 201310581945.2 and 201910443870.9. The pressure of thi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26G01R1/02G01R1/04G01R1/073G05B19/04G01L19/12
CPCG01L19/12G01R1/02G01R1/04G01R1/07307G01R31/2601G05B19/04
Inventor 蒋锴李春勇舒凯仇伯仓柯毛龙徐化勇冯欧
Owner 江西德瑞光电技术有限责任公司
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