Storage test method and device and electronic equipment

A test method and equipment technology, applied in the computer field, can solve the problems of insufficient number of hosts in the test environment, high test cost, and low degree of automation, etc., to achieve efficient and convenient storage test, reduce test cost, and speed up test progress Effect

Inactive Publication Date: 2021-03-02
SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] There are two deficiencies in the existing testing technology. The first is that it is not easy to fully test some storage functions.
For example, in order to support the cloud environment, the current storage supports a very high number of hosts, and the number of hosts in

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Storage test method and device and electronic equipment
  • Storage test method and device and electronic equipment
  • Storage test method and device and electronic equipment

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0039] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are part of the embodiments of the present invention, not all of them. the embodiment. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0040] The terms "including" and "having" mentioned in the embodiments of the present invention and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device comprising a series of steps or units is not limited to the listed steps or units, but optionally also includes other unlisted steps or units, or optionally a...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a storage test method and apparatus, and an electronic device, belongs to the technical field of computers, and solves the problems that some storage functions are not easy to fully test and the automation degree is not high in an existing test technology. The method comprises the steps of performing region division on a test host and a memory to obtain a region corresponding relationship between the test host and the memory; virtualizing a plurality of virtual fiber channel cards for the FC card of each test host; mapping a stored storage volume device to a corresponding virtual fiber channel card according to the area corresponding relation; and indicating the test host to identify the storage volume device corresponding to the virtual fiber channel card. The FC virtualization technology is adopted, and a physical card is simulated into a plurality of virtual optical fiber channel cards. And each virtual optical fiber channel card is defined as a host at the storage end, so that the requirement of a test environment on the number of hosts is met. And meanwhile, automation of the test is realized by utilizing the characteristic of virtualization flexibilityof the FC card.

Description

technical field [0001] The invention relates to the technical field of computers, in particular to a storage test method, device and electronic equipment. Background technique [0002] With the rapid development of cloud and big data technologies, high-performance and large-capacity storage are developing rapidly. In order to master various storage characteristics and take advantage of various new storage technologies, it is necessary to fully test the storage. [0003] The most commonly used connection method in the storage field is a SAN network, and hosts access storage through FC cards. [0004] The SAN network is a dedicated storage network, and the automatic operation and maintenance management technology involves less. Existing routine storage testing generally adopts the method of manually building a test environment. First, divide the storage network into zones, and identify the storage to the host FC card. Then the storage performs logical volume mapping, and t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06F11/36
CPCG06F11/3684G06F11/3688
Inventor 于培亮
Owner SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap