Storage test method and device and electronic equipment

Abstract

The invention provides a storage test method and apparatus, and an electronic device, belongs to the technical field of computers, and solves the problems that some storage functions are not easy to fully test and the automation degree is not high in an existing test technology. The method comprises the steps of performing region division on a test host and a memory to obtain a region corresponding relationship between the test host and the memory; virtualizing a plurality of virtual fiber channel cards for the FC card of each test host; mapping a stored storage volume device to a corresponding virtual fiber channel card according to the area corresponding relation; and indicating the test host to identify the storage volume device corresponding to the virtual fiber channel card. The FC virtualization technology is adopted, and a physical card is simulated into a plurality of virtual optical fiber channel cards. And each virtual optical fiber channel card is defined as a host at the storage end, so that the requirement of a test environment on the number of hosts is met. And meanwhile, automation of the test is realized by utilizing the characteristic of virtualization flexibilityof the FC card.

Description

technical field [0001] The invention relates to the technical field of computers, in particular to a storage test method, device and electronic equipment. Background technique [0002] With the rapid development of cloud and big data technologies, high-performance and large-capacity storage are developing rapidly. In order to master various storage characteristics and take advantage of various new storage technologies, it is necessary to fully test the storage. [0003] The most commonly used connection method in the storage field is a SAN network, and hosts access storage through FC cards. [0004] The SAN network is a dedicated storage network, and the automatic operation and maintenance management technology involves less. Existing routine storage testing generally adopts the method of manually building a test environment. First, divide the storage network into zones, and identify the storage to the host FC card. Then the storage performs logical volume mapping, and t...

AI Technical Summary

Problems solved by technology

[0005] There are two deficiencies in the existing testing technology. The first is that it is not easy to fully test some storage functions.

For example, in order to support the cloud environment, the current storage supports a very high number of hosts, and the number of hosts in the test environment is not enough for full testing, or the cost of testing is very high

The second point is that the degree of automation is not high. It is necessary to check the WWN of the host FC card, and then perform host definition and mapping operations on the storage side.

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