A method for quickly measuring the overfire temperature of stone cultural relics
A kind of stone cultural relics, overfire technology, applied in the direction of measuring devices, particle size analysis, optical testing flaws/defects, etc., can solve the problems of high cost, damage monitoring system, sample size limitation, etc., to achieve less damage to cultural relics and accurate test results , Evaluate quick results
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0062] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention more clear, the embodiments of the present invention will be further described in detail below in conjunction with the embodiments and accompanying drawings. Here, the exemplary embodiments and descriptions of the present invention are used to explain the present invention, but not to limit the present invention.
[0063] It is to be understood that the terms "comprising / comprising", "consisting of" or any other variation thereof are intended to cover a non-exclusive inclusion such that a product, apparatus, process or method comprising a set of elements includes not only those elements , and may include other elements not expressly listed, or elements inherent in the product, apparatus, process or method, as required. Without further limitations, an element defined by the phrase "comprising / comprising...", "consisting of... does not exclude the presence of addit...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com