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Regression testing method, system and device and readable storage medium

A regression test, a technology to be tested, applied in computer-aided design, CAD circuit design, special data processing applications, etc., can solve problems such as increasing development difficulty

Active Publication Date: 2021-03-09
HYGON INFORMATION TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For the regression test environment of different subsystems, the internal process structure control may be completely different, so the addition of new functions will be a customized work for the regression test environment of each subsystem, which will increase the regression test environment to support this new function development difficulty

Method used

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  • Regression testing method, system and device and readable storage medium
  • Regression testing method, system and device and readable storage medium
  • Regression testing method, system and device and readable storage medium

Examples

Experimental program
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Effect test

Embodiment 1

[0043] In order to solve the global adjustment of the project from the SoC level when performing regression testing for each subsystem in the existing SoC, it is necessary to modify the regression testing environment of each subsystem, which increases the repetitive work of changing the regression testing environment It is easy to cause the mismatch of different regression test environment settings, as well as the existing functions supported by regression test. If a new function needs to be added, each verification team needs to follow the process in their respective regression test environment The structure determines how to embed the new function, so that the addition of the new function becomes a customized work for the regression test environment of each subsystem, which increases the difficulty of the development of the regression test environment to support the new function. In the embodiment of the present application, a regression testing method is provided. In this me...

Embodiment 2

[0095] Based on the same inventive concept, an embodiment of the present application also provides a regression testing system. see Figure 4 as shown, Figure 4 A regression testing system corresponding to the regression testing method shown in Embodiment 1 is shown. It should be understood that for the specific functions of the regression testing system, reference may be made to the above description, and to avoid repetition, the detailed description is appropriately omitted here. The regression testing system includes at least one software function module that can be stored in the memory in the form of software or firmware or solidified in the operating system of the regression testing device carrying the system. specifically:

[0096] see Figure 4 As shown, the regression testing system includes: a regression testing environment configuration layer 101 and a regression testing running layer 102 . Among them: the regression test environment configuration layer 101 can...

Embodiment 3

[0110] In this embodiment, on the basis of Embodiment 2, a specific regression testing process is taken as an example to illustrate the solution of the embodiment of the present application.

[0111] 1. The regression test control of the subsystem is divided into two hierarchical structures: the regression test environment configuration layer and the regression test operation layer.

[0112] 1.1. Regression test environment configuration layer.

[0113] The regression test environment configuration layer is shared by the regression test environments of each subsystem. The problem to be solved is mainly the unification of the regression test environment management of different subsystems, including:

[0114] a. Setting of the regression test environment parameters of the regression test environment.

[0115] The correct setting of regression test environment parameters is the prerequisite for each regression test environment to start. In the embodiment of the present applicat...

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Abstract

The invention provides a regression testing method, system and device and a readable storage medium, and the method comprises the steps: configuring regression testing environment parameters, and building a database of a regression testing environment according to the environment configuration corresponding to a to-be-tested subsystem; and generating a command set of each sub-environment corresponding to the to-be-tested subsystem according to the regression operation configuration of the to-be-tested subsystem, and calling a target thread of each sub-environment to execute a command in the command set of each sub-environment. As the configuration of the regression testing environment parameters and the establishment of the database which are firstly carried out are common processes duringthe testing of all subsystems, scripts for realizing the mode can be reused by all subsystems, and a regression testing environment modification requirement on an SoC level or a function supported bya certain regression test is required to be added, only updating and adjusting need to be carried out in the scripts for achieving regression testing environment parameter configuration and regression testing environment database establishment, and the workload of regression testing is reduced.

Description

technical field [0001] The present application relates to the technical field of integrated circuit verification, and in particular, to a regression testing method, system, device and readable storage medium. Background technique [0002] Today's SoC (System-on-a-Chip, system-level chip) design is becoming more and more complex. From the design level, SoC is composed of many subsystems, and each subsystem is composed of multiple IP (Intellectual Property, intellectual property rights). ) core. Correspondingly, the verification team needs to build corresponding subsystem verification environments and IP verification environments under their respective subsystems to perform layered verification of the entire SoC chip. [0003] Both the subsystem verification environment and the IP verification environment under it need to be verified through regression testing. Different subsystems are often handed over to different verification teams to be responsible for verification. The ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/3308G06F115/02G06F115/08
CPCG06F30/3308G06F2115/02G06F2115/08
Inventor 杨晶晶王芳沈旭焦瑞李冬梅
Owner HYGON INFORMATION TECH CO LTD