Simulation test system and method for sinc filter of sigma-ADC chip

Abstract

The invention provides a sinc filter simulation test system and method for a sigma ADC chip, and the system comprises a data source generation module which is used for simulating the output and inputsignals of the sigma ADC chip, and a test module which is used for transmitting read bit stream data to a to-be-tested module according to a clock signal; and a to-be-tested module used for receivingthe transmitted bit stream data and displaying the transmitted bit stream data as a filtering signal. According to the invention, the two sine waves are superposed, and then the superposed waveform ismodulated to obtain the bit stream data, so that the output and input signals of the sigma ADC chip are simulated, the clock signal is modulated, the bit stream data is read according to the clock signal, the low-pass filtering effect can be achieved, the waveform can be observed in the modulation process. By simulation test, the filtering effect can be verified in the early stage and corrected in time, a circuit testing environment does not need to be built, modulation efficiency is improved, and cost is reduced.

Description

technical field [0001] The invention mainly relates to the technical field of signal modulation, in particular to a sinc filter simulation test system and method for a Σ-Δ ADC chip. Background technique [0002] The current Σ-ΔADC chip outputs a high-frequency bit stream through oversampling technology, but the high-frequency signal needs to be filtered through the modulation process to obtain an effective signal. [0003] However, the conventional debugging device is too simple and directly outputs the signal result. If the result is inaccurate, it is impossible to judge where the problem occurs. Repeated debugging is required, which makes the filtering effect poor and inefficient; there is also a way to build a circuit test environment. To debug, but the cost of this method is relatively high. Contents of the invention [0004] The technical problem to be solved by the present invention is to provide a sinc filter simulation test system and method for a Σ-Δ ADC chip for...

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Problems solved by technology

[0003] However, the conventional debugging device is too simple and directly outputs the signal result. If the result is inaccurate, it is impossible to judge where the problem occurs. Repeated debugging is required, which makes the filtering effect poor and inefficient; there is also a way to build a circuit test environment. to debug, but the cost of this method is relatively high

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