Test platform for analog circuit

Abstract

The invention discloses a test platform for an analog circuit. The test platform comprises a main control computer, a discrete instrument, a test resource mother board and a DUT test daughter board, the discrete instrument is connected to a circuit to be tested through the test resource mother board and the DUT test daughter board. Wherein the main control computer adopts a computer with a Labviewdevelopment platform and comprises a view module, a controller module and a test model module; discrete instrument test resources are integrated through the main control computer, test excitation application and device response collection are controlled through the main control computer, and the complex steps of a transmission manual test process are replaced; in the testing process, automatic testing can be achieved only by installing the matched DUT testing daughter board according to a circuit to be tested and selecting an appropriate testing model. The test result data can be automatically stored, and the test platform effectively improves the test efficiency and the test reliability by simplifying the test steps, solidifying the test method and performing test datamation.

Description

technical field [0001] The invention belongs to the technical field of analog circuit testing, in particular to a testing platform for analog circuits. Background technique [0002] At present, the requirements for the reliability of general analog circuits are getting higher and higher, and the requirements for the coverage of analog circuit test parameters are also increased simultaneously; generally, the automatic test of parameters and data can be realized through programming of automatic test equipment ATE (Automatic Test Equipment). The analog circuit parameters stored and processed are called conventional parameters; and some analog circuit parameters that cannot pass the ATE automatic test in the existing analog circuit test are called "special parameters"; "special parameters" have special test conditions, and the test process Complicated, automatic test equipment ATE has the characteristics of high difficulty in test program development and high test cost. [0003...

AI Technical Summary

Problems solved by technology

[0009] Aiming at the technical problems existing in the prior art, the present invention provides a testing platform for analog circuits

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