Fault test method and device

A fault testing and fault technology, applied in the computer field, can solve problems such as the occurrence time and the occurrence sequence cannot be determined.
CN112596934APending Publication Date: 2021-04-02AGRICULTURAL BANK OF CHINA
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Patent Information

Authority / Receiving Office
CN Β· China
Patent Type
Applications(China)
Current Assignee / Owner
AGRICULTURAL BANK OF CHINA
Publication Date
2021-04-02

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Abstract

The invention provides a fault test method and device, and the method comprises the steps: extracting a to-be-tested fault from a fault set, selecting a node from a distributed system, injecting the to-be-tested fault into the node in a preset period, and recording the corresponding relation between the to-be-tested fault and the node till the distributed system cannot work normally; and after thedistributed system is repaired, injecting the to-be-tested fault into the corresponding node according to the corresponding relationship, if the distributed system returns to normal work, indicatingthat the distributed system is successfully repaired, and if the distributed system cannot work normally, indicating that the distributed system fails to be repaired. The corresponding relation between the faults and the nodes is recorded, the faults are injected into the corresponding nodes through the corresponding relation, and whether the distributed system is successfully repaired or not is judged, so that the faults can be accurately and efficiently tested; and fault extraction and node selection are carried out randomly, so that the situations of fault generation and unknown node distribution are simulated more accurately, and the accuracy in verifying the availability of the distributed system is improved.
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Description

technical field

[0001] The present invention relates to the technical field of computers, in particular to a fault testing method and device. Background technique

[0002] Availability refers to the probability or time occupancy expectation that the system can operate normally within a certain period of time. High availability is one of the goals that a distributed system needs to achieve. In order to verify whether the distributed system has achieved high availability, the fault can be injected into the nodes of the distributed system by creating chaos engineering to observe the fault tolerance of the distributed system.

[0003] However, due to the variety of faults, and the time and sequence of occurrence cannot be determined, an efficient fault testing method is urgently needed to verify the availability of distributed systems. SUMMARY OF THE INVENTION

[0004] In view of this, the purpose of the present invention is to provide a fault testing method and apparatus to ...

Claims

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