The invention provides a storage test device and method, and the device comprises a processor which is electrically connected with a to-be-tested
machine through a plurality of channels, and a
temperature control module is used for controlling the placement environment temperature of the storage test device; the working chain control module is used for configuring and calling a working chain of the to-be-tested
machine, and the working chain at least comprises a starting step of the to-be-tested
machine, a read-write step of the to-be-tested machine, a power failure
processing step of the to-be-tested machine and a working state adjusting step of the to-be-tested machine; the
power consumption calculation module is electrically connected to the plurality of to-be-tested machines, records the power
supply current of the main controller as a first power
supply current at each node of the working chain, records the power
supply current of the
flash memory chip as a second power supply current, and calculates the
power consumption of the to-be-tested machines according to the first power supply current, the second power supply current and the
power supply voltage of the to-be-tested machines; and obtaining
power consumption data of the to-be-tested machine at each node of the working chain. The performance of the storage device can be accurately and efficiently evaluated.