The present disclosure provides a method and device for testing a circuit board, electronic equipment and a storage medium. The method comprises: determining template data of a to-be-tested circuit board based on component information of the to-be-tested circuit board; determining sample template data corresponding to the to-be-tested circuit board; performing template defect detection on the template data of the to-be-tested circuit board based on the sample template data to obtain a target soldering area in a non-defect area; and controlling a mechanical arm to test the to-be-tested circuit board based on the target soldering area.