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59results about How to "Accurate and efficient testing" patented technology

Intelligent test system and method for metering device circuit board

PendingCN106970318AMeet the needs of high-volume testingAvoid man-made damagePrinted circuit testingFunctional testingIdentification device
The invention discloses an intelligent test system and method for a metering device circuit board, belongs to the circuit board detection technology field and solves a problem of low efficiency caused by manual detection existing in a metering device circuit board in the prior art. The intelligent test system comprises a programming device used for realizing programming of function programs into a to-be-tested circuit board, a display performance test device used for testing display performance of the to-be-tested circuit board, a function test device used for testing functions of the to-be-tested circuit board, an identification device used for identifying the to-be-tested circuit board according to test results of the display performance test device and the function test device, a circuit board conveying mechanism which is connected with the programming device and is used for conveying the to-be-tested circuit board to the programming device, and a main control unit used for controlling operation of the programming device, the display performance test device, the function test device, the identification device and the circuit board conveying mechanism. The intelligent test system is advantaged in that the intelligent test system is applicable to circuit board tests of various types of intelligent gas meters.
Owner:GOLDCARD HIGH TECH

System and method for overcurrent protection and voltage monitoring device burn-in test

ActiveCN104849582AAccurate and efficient testingTimely detection of existing defectsElectrical testingEngineeringSwitching power
The invention discloses a system and a method for overcurrent protection and voltage monitoring device burn-in test. The system comprises a cabinet, a front-end processor, a test signal source, an acquisition control device, and a switching power supply. The method comprises: the front-end processor parsing a test case to a control command; the test signal source sending test signals to the acquisition control device; the acquisition control device receiving the control command, and acquiring monitored data of the overcurrent protection and voltage monitoring device, and feeding back to the front-end processor. The overcurrent protection and voltage monitoring device comprises a relay panel, a mainboard, and a display screen. The relay receives test signals. The display screen sets a given threshold value. The mainboard receives a burn-in test. The system and the method for overcurrent protection and voltage monitoring device burn-in test use automated, intelligent, and integrated online monitoring measures, and can accurately and efficiently test functions of the overcurrent protection and voltage monitoring device, and can find out defects of the overcurrent protection and voltage monitoring device, so as to effectively reduce fault risks of nuclear power station circuits.
Owner:CHINA GENERAL NUCLEAR POWER OPERATION +2

Communication equipment test device

The invention relates to a communication equipment test device, which comprises a computer, a high-low-level controller, a test interface selection core module, a test module and a variable microwave module, wherein the computer is used for running test control software and for transmitting an interface control signal the high-low-level controller is provided with an input end and an output end, and the input end is connected with the computer and receives the interface control signal and generates a corresponding level signal; the test interface selection core module is connected with high-low-level controller and is provided with a plurality of test input interfaces and a plurality of test output interfaces, each test input interface is respectively connected with each test output interface, the high-low-level controller receives the interface control signal and selects a corresponding test input interface; the test module comprises a test part for testing each parameter of tested element; and the variable microwave module comprises multiple microwave parts. Due to the adoption of the communication equipment test device, the automatic test of each tested interface can be realized, different test parts can be selected according to different indexes to be tested, the test is flexible, rapid, high efficient and correct, the test cost can be reduced, and the test efficiency can be improved.
Owner:FILTRONIC SUZHOU TELECOMM PROD CO LTD

Set of primers and probes to be used for identification of gene polymorphism and use thereof

InactiveUS20160053309A1Accurately and efficiently testSuperior flexibilityMicrobiological testing/measurementLibrary screeningFluorescenceOligonucleotide
By establishing a simple method for extracting a nucleic acid from a human specimen, and using the LAMP method, which is an isothermal gene amplification method showing superior quickness and convenience, with a concept of measurement different from the conventional ones, there is established a test method including steps up to detection with a measurement apparatus. There is provided a method for detecting a target site, which is an LAMP method using four kinds of primers, FIP, F3 primer, BIP, and B3 primer, which are designed on the basis of six regions of a template polynucleotide, F1 region, F2 region, F3 region, B1 region, B2 region, and B3 region, wherein: the template polynucleotide contains the target site, the four kinds of primers are designed so that the target site exists between the F1 region and the F2 region, or between the B1 region and the B2 region; a loop primer designed on the basis of a region between the F1 region and the F2 region or between the B1 region and the B2 region on the side on which the target site exists, and an oligonucleotide probe that can associate with a region including the target site are used, the loop primer and the probe are designed so that the 5′ end of the loop primer and the 3′ end of the probe associate with the template polynucleotide at positions close to each other, one of the loop primer and the probe is modified with a fluorescent molecule around the 5′ end in the case of the loop primer or the 3′ end in the case of the probe, and the other is modified with a quenching molecule.
Owner:NIPPON GENE

Monitoring device and method for testing process and computer readable storage medium

The invention discloses a monitoring device of test process, comprises memory and processor, the memory has stored thereon a test monitoring program executable on a processor that, when executed by the processor, performs the following steps: When a test instruction triggered by the test subunit of the user based on the test case is detected, executing a test subunit on a basis of the test instruction to test the tested system; when receiving code execution information obtained by the execution test subunit returned by the system under test, executing a test subunit to test a system under testbased on a test instruction; when receiving code execution information obtained by the execution test subunit returned by the system under test, obtaining time information from the code execution information; Generating a method call path corresponding to the test subunit according to the time information; and repeating the above steps until all execution of a test subunits contained in a test case is completed, and generating a method call path corresponding to a test case according to method call path corresponding to each test subunit. The invention further provides a monitoring method ofa test process and a computer readable storage medium. According to the invention, accurate and efficient testing is realized.
Owner:PING AN TECH (SHENZHEN) CO LTD

Plate surface wear resistance testing device for building indoor decoration

The invnetion discloses a plate surface abrasion resistance testing device for building interior decoration. The device comprises a supporting rack, a lifting driving piece, a lifting assembly, a mainmovement driving piece, a main movement middle transmission piece, a grinding head conversion driving piece, a grinding head mounting rotary disc and a plurality of abrasion resistance testing grinding head assemblies. The lifting driving piece is arranged on the supporting rack; the lifting assembly is connected to the lifting driving piece, the main motion driving piece is arranged on the lifting assembly, the main movement middle transmission piece is rotationally arranged on the lifting assembly, the grinding head conversion driving piece is arranged on the lifting assembly, and the grinding head mounting rotary disc is rotationally connected to the lower portion of the lifting assembly. A plurality of abrasion resistance testing grinding head assemblies are arranged on the outer peripheral wall of the grinding head mounting rotary disc, and a clamping assembly is arranged at the lower part of the supporting rack; the power input end of the main movement middle transmission pieceis in transmission connection with the main movement driving piece, and the power output end of the main movement middle transmission piece is in transmission connection with one of the abrasion resistance testing grinding head assemblies. The device greatly improves the test efficiency and applicability.
Owner:山东德才建设有限公司

Measuring system for measuring molecular electrical properties by consolidation method

The invention discloses a measuring system for measuring molecular electrical properties by a consolidation method, wherein a piezoelectric ceramic tube in a vertical cylindrical shape is vertically fixed in the center of a lifting platform, the top and bottom ends of the piezoelectric ceramic tube respectively pass through the top surface and bottom surface of the lifting platform, and a gold probe electrode is disposed at the central position of the bottom end surface of the piezoelectric ceramic tube; a support rod lifts the lifting platform directly above a sample stage, the gold probe electrode is directly located above the sample stage, a rectangular sample slot is arranged at the center of the top surface of the sample stage, and a gold piece is placed in the sample slot. The modules in the system provided by the invention comprise a piezoelectric ceramic tube control module, a linear displacement driver control module, a data acquisition module, a data processing module, an experimental real-time adjustment module and an electrochemical workstation. The measuring system is simple in structure, low in cost, and simple in operation, has the advantages such as immediacy, accuracy, real-time, simple operation and easy learning, and can provide rich molecular internal information at a single molecular level through electrical measurement.
Owner:WUHAN UNIV OF SCI & TECH

Electric breakdown life testing method, device and system of TSV structure and control equipment

The invention relates to an electric breakdown life testing method, device and system of a TSV structure and control equipment. The method comprises the following steps of acquiring an initial leakagecurrent of a to-be-tested TSV matrix wafer sample under an initial voltage through signal acquisition equipment in a first temperature cycle period, wherein the first temperature cycle period is a first period of controlling temperature adjusting equipment to adjust the test environment temperature of the to-be-tested TSV matrix wafer sample to be changed cyclically; when the initial leakage current is lower than or equal to a preset value, controlling power supply equipment to gradually increase a voltage applied to the to-be-tested TSV matrix wafer sample by taking the initial voltage as astarting point, and acquiring a current leakage current of the to-be-tested TSV matrix wafer sample in real time through the signal acquisition equipment; and when the current leakage current meets failure criteria, obtaining a total voltage adjusting duration of the power supply equipment, and confirming the total duration as the failure time of the to-be-tested TSV matrix wafer sample. The service life performance of the TSV structure is efficiently and accurately tested, and the electric breakdown reliability of the TSV structure is efficiently and accurately tested.
Owner:CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST

Fault test method and device

The invention provides a fault test method and device, and the method comprises the steps: extracting a to-be-tested fault from a fault set, selecting a node from a distributed system, injecting the to-be-tested fault into the node in a preset period, and recording the corresponding relation between the to-be-tested fault and the node till the distributed system cannot work normally; and after thedistributed system is repaired, injecting the to-be-tested fault into the corresponding node according to the corresponding relationship, if the distributed system returns to normal work, indicatingthat the distributed system is successfully repaired, and if the distributed system cannot work normally, indicating that the distributed system fails to be repaired. The corresponding relation between the faults and the nodes is recorded, the faults are injected into the corresponding nodes through the corresponding relation, and whether the distributed system is successfully repaired or not is judged, so that the faults can be accurately and efficiently tested; and fault extraction and node selection are carried out randomly, so that the situations of fault generation and unknown node distribution are simulated more accurately, and the accuracy in verifying the availability of the distributed system is improved.
Owner:AGRICULTURAL BANK OF CHINA

Electrical test head used for keyboard key testing

The invention discloses an electrical test head used for keyboard key testing. The electrical test head comprises a holder which is vertically distributed, first and second expansion joints which are orderly arranged on the holder, fixation ring, a limiting ring and a test head assembly which is arranged on the fixation ring, wherein the fixation ring and the limiting ring are respectively arranged on first and second expansion joints. The test head assembly comprises an electromagnet and a weight from top to bottom, wherein the electromagnet and the weight are in lap connection. The electromagnet is fixed on the fixation ring. The top end of the electromagnet is a free end and is connected with a test wire. The bottom end of the electromagnet runs into the top end of the weight and is locked by a gasket. The weight is sleeved by the limiting ring. The top end of the weight is in sleeve joint with the bottom end of the electromagnet, and is hung on and in lap connection with the gasket. The bottom end of the weight is a free end, and acts on keys in a keyboard to be tested. The weight acts on the keys, is stressed upward, and moves upward along the bottom end of the electromagnet. The electrical test head has the advantages of compact structure, high practicability, high automation degree, accurate and efficient testing, flexible, smooth and precise adjustment, and high versatility, and is suitable for keyboard key layout of different products.
Owner:KUNSHAN HONGZHIXI AUTOMATION EQUIP

Fault monitoring period test method and system and computer storage medium

The invention provides a fault monitoring period test method and system and a computer storage medium, and the test method comprises the steps: building a test environment, and enabling the time of ahost and the time of a BOX server BMC to be adjusted to be consistent; simulating BOX errors, and recording simulation time; monitoring the host log, and recording the received corresponding alarm time; repeating the test process, and respectively calculating the time difference between the corresponding simulation time and alarm time; and according to the time difference, obtaining a test monitoring period, and comparing the test monitoring period with an actual monitoring period to obtain a test result of the monitoring period. According to the method, the fault of the BOX server is simulated, the time is recorded, the fault log of the host is monitored, the alarm log corresponding to the simulated fault is screened, the alarm time is recorded, and whether the current monitoring period is abnormal or not is judged by comparing the time difference between the recorded time and the alarm time with the actual monitoring period. The whole process does not need human participation, and the abnormal condition of the monitoring period can be accurately and efficiently tested.
Owner:SUZHOU LANGCHAO INTELLIGENT TECH CO LTD

Electrical test head used for keyboard key electrical performance testing

The invention discloses an electrical test head used for keyboard key electrical performance testing. The electrical test head comprises a holder which is vertically distributed, first and second crossbars which vertically pass through and are locked on the holder, a fixation ring, a limiting ring and a test head assembly which is arranged on the fixation ring, wherein the fixation ring and the limiting ring are respectively arranged on the same side end of first and second crossbars. The test head assembly comprises an electromagnet and a weight from top to bottom, wherein the electromagnet and the weight are in lap connection. The electromagnet is fixed on the fixation ring. The top end of the electromagnet is a free end and is connected with a test wire. The bottom end of the electromagnet runs into the top end of the weight and is locked by a gasket. The weight is sleeved by the limiting ring. The top end of the weight is in sleeve joint with the bottom end of the electromagnet, and is hung on and in lap connection with the gasket. The bottom end of the weight is a free end, and acts on keys in a keyboard to be tested. The weight acts on the keys, is stressed upward, and moves upward along the bottom end of the electromagnet. The electrical test head has the advantages of high automation degree, accurate and efficient testing, flexible, smooth and precise adjustment, and high versatility, and is suitable for keyboard key layout of different products.
Owner:KUNSHAN HONGZHIXI AUTOMATION EQUIP
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