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Monitoring device and method for testing process and computer readable storage medium

A technology of testing process and monitoring device, applied in the computer field, can solve the problem of obtaining method calling path and the like

Inactive Publication Date: 2018-10-16
PING AN TECH (SHENZHEN) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The present invention provides a monitoring device, method and computer-readable storage medium for a test process, the main purpose of which is to solve the technical problem that the method call path of the system under test during the test process cannot be obtained through the monitoring of the test process, and realize Accurate and efficient testing

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  • Monitoring device and method for testing process and computer readable storage medium
  • Monitoring device and method for testing process and computer readable storage medium
  • Monitoring device and method for testing process and computer readable storage medium

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Embodiment Construction

[0047] It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0048] The invention provides a monitoring device for a testing process. refer to figure 1 Shown is a schematic diagram of a preferred embodiment of the monitoring device for the testing process of the present invention.

[0049] In this embodiment, the monitoring device 1 of the testing process may be a PC (Personal Computer, personal computer), or may be a terminal device such as a smart phone, a tablet computer, or a portable computer. The monitoring device 1 of the test process at least includes a memory 11 , a processor 12 , a communication bus 13 , and a network interface 14 .

[0050] Wherein, the memory 11 includes at least one type of readable storage medium, and the readable storage medium includes flash memory, hard disk, multimedia card, card-type memory (eg, SD or DX memory, etc.), magnetic memory, magn...

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PUM

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Abstract

The invention discloses a monitoring device of test process, comprises memory and processor, the memory has stored thereon a test monitoring program executable on a processor that, when executed by the processor, performs the following steps: When a test instruction triggered by the test subunit of the user based on the test case is detected, executing a test subunit on a basis of the test instruction to test the tested system; when receiving code execution information obtained by the execution test subunit returned by the system under test, executing a test subunit to test a system under testbased on a test instruction; when receiving code execution information obtained by the execution test subunit returned by the system under test, obtaining time information from the code execution information; Generating a method call path corresponding to the test subunit according to the time information; and repeating the above steps until all execution of a test subunits contained in a test case is completed, and generating a method call path corresponding to a test case according to method call path corresponding to each test subunit. The invention further provides a monitoring method ofa test process and a computer readable storage medium. According to the invention, accurate and efficient testing is realized.

Description

technical field [0001] The invention relates to the field of computer technology, in particular to a monitoring device, method and computer-readable storage medium for a test process. Background technique [0002] In the existing manual and automated system testing, it is necessary to locate the defects in the system under test according to the test situation. However, in the existing testing methods, it is impossible to evaluate the test situation according to the execution success rate of the test cases. The specific defect location at the code level is mainly because the existing test methods cannot obtain the method call path of the system under test during the test process based on the monitoring of the test process. If you want to obtain the method call path of the system under test, you can only Analyze the logic of the source code of the system under test by means of static analysis, draw the method call path diagram by yourself, and then locate the defects of the sy...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/30G06F11/36
CPCG06F11/302G06F11/3065G06F11/3688G06F11/3692
Inventor 邹文涛毛皓李克标
Owner PING AN TECH (SHENZHEN) CO LTD
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