Data testing method and device, electronic equipment and storage medium

A technology for data testing and electronic equipment, applied in the field of data processing, can solve problems affecting test efficiency, etc., and achieve the effect of efficient and accurate automatic testing

Active Publication Date: 2021-12-10
FU TAI HUA IND SHENZHEN +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, each workstation may have thousands or even hundreds of test parameters, and manual analysis will obviously seriously affect test efficiency

Method used

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  • Data testing method and device, electronic equipment and storage medium
  • Data testing method and device, electronic equipment and storage medium
  • Data testing method and device, electronic equipment and storage medium

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Embodiment Construction

[0080] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0081] Such as figure 1 Shown is a flow chart of a preferred embodiment of the data testing method of the present invention. According to different requirements, the order of the steps in the flowchart can be changed, and some steps can be omitted.

[0082] The data testing method is applied to one or more electronic devices, and the electronic device is a device that can automatically perform numerical calculation and / or information processing according to preset or stored instructions, and its hardware includes but is not limited to Microprocessor, application specific integrated circuit (Application Specific Integrated Circuit, ASIC), programmable gate array (Field-Programmable Gate Array, FPGA), digital processor (Digital Signal Processor, DS...

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Abstract

The invention provides a data testing method and device, electronic equipment and a storage medium. The method comprises the following steps: in response to a received data test instruction, obtaining a to-be-tested parameter from the data test instruction; obtaining target data corresponding to the to-be-tested parameters from an initial data set; removing discrete points in the target data based on a DBSCAN clustering algorithm, carrying out clustering, and obtaining at least one cluster; determining the number of the clusters; in response to the fact that the number of the clusters is larger than a preset threshold value, constructing a scatter diagram based on the at least one cluster; inputting the scatter diagram into a pre-trained prediction model for comparison to obtain a target function; and performing regression analysis on the target data by using the target function to obtain an analysis result, and verifying the to-be-tested parameter according to the analysis result. According to the invention, the corresponding function can be automatically identified to test the to-be-tested parameter.

Description

technical field [0001] The invention relates to the technical field of data processing, in particular to a data testing method, device, electronic equipment and storage medium. Background technique [0002] Each station on the production line provides a certain process of the product. In order to ensure the normal operation of the production line, usually after the completion of this process, it is necessary to test the process on the production line, and then enter the next station after passing the test. , and the next station will have another set of pre-tests to ensure that the quality of the semi-finished products produced by the previous station is correct. [0003] If it does not pass the test, it will go into heavy repairs, resulting in higher costs. Therefore, if it is possible to predict whether the preliminary test can be passed before entering the next station, the time wasted between testing and maintenance can be effectively saved. [0004] At present, to pre...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06Q10/06G06K9/62
CPCG06Q10/0633G06Q10/0639G06F18/2321G06F18/23211G06F18/24133G06F18/23G06F18/24137G06F18/24147
Inventor 王正峯
Owner FU TAI HUA IND SHENZHEN
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