Method and device for generating binaural pin defect sample based on generative adversarial network

A defect and network technology, applied in the field of double-ear pin defect sample generation, can solve problems such as difficulty in adapting to high-speed, accurate and automatic detection, loose catenary components, hidden dangers of train safety operation, etc., and achieve good training results

Pending Publication Date: 2021-04-16
CHINA ACADEMY OF RAILWAY SCI CORP LTD +2
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Problems solved by technology

Due to the vibration and impact during the long-term operation of the train, it may cause the catenary components to loosen and fall off, which will bring great hidden dangers to the safe operation of the train. It is particularly important to find defects in time and take troubleshooting measures
Traditional railway track equipment maintenance relies on manual inspection, which is difficult to adapt to the trend of high-speed, accurate and automated inspection
In recent years, many defect detection methods based on deep learning have been proposed and put into practical use, but these methods often have high data requirements, and in the actual production environment, the number of real defect samples is less than that

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  • Method and device for generating binaural pin defect sample based on generative adversarial network
  • Method and device for generating binaural pin defect sample based on generative adversarial network
  • Method and device for generating binaural pin defect sample based on generative adversarial network

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[0026] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention more clear, the embodiments of the present invention will be further described in detail below in conjunction with the accompanying drawings. Here, the exemplary embodiments and descriptions of the present invention are used to explain the present invention, but not to limit the present invention.

[0027] Figure 8 It is a schematic flowchart of a method for generating a double-eared pin defect sample based on a generative adversarial network in an embodiment of the present invention, as shown in Figure 8 As shown, the method includes the following steps:

[0028] Step 101: collecting a double ear pin sample image to obtain a double ear pin sample image data set; the double ear pin sample image data set includes a normal sample image data set and a defect sample image data set;

[0029] Step 102: Use the double ear pin sample image data set to train the cycle...

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Abstract

The invention discloses a method and device for generating a binaural pin defect sample based on a generative adversarial network, and the method comprises the steps: collecting a binaural pin sample image, and obtaining a binaural pin sample image data set, wherein the binaural pin sample image data set comprises a normal sample image data set and a defect sample image data set; training a CycleGAN model by using the binaural pin sample image data set to obtain a paired sample image data set, wherein the paired sample images comprise a normal sample image and a correspondingly generated defect sample image; and training a Pix2Pix network model by using the paired sample image data set to obtain a binaural pin defect sample based on the generative adversarial network. According to the method, characteristics of various generative adversarial network models are combined, defect sample images with vivid corresponding effects can be effectively generated by processing normal samples, a balanced data set with rich characteristics is provided for subsequent training of a defect detection model, and thus the model obtains a good training effect.

Description

technical field [0001] The present invention relates to the technical field of image processing, in particular to a method and device for generating a double ear pin defect sample based on a generative adversarial network. Background technique [0002] This section is intended to provide a background or context to embodiments of the invention that are recited in the claims. The descriptions herein are not admitted to be prior art by inclusion in this section. [0003] Rotating double lugs are important fasteners in catenary suspensions for high-speed railways. Due to the vibration and impact during the long-term operation of the train, catenary components may loosen and fall off, which brings great hidden dangers to the safe operation of the train. It is particularly important to find defects in time and take elimination measures. Traditional railway track equipment maintenance relies on manual inspection, which is difficult to adapt to the trend of high-speed, accurate an...

Claims

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Application Information

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IPC IPC(8): G06K9/62G06N3/04G06N3/08B61K9/00
Inventor 杜馨瑜顾子晨高绍兵邱健珲程雨
Owner CHINA ACADEMY OF RAILWAY SCI CORP LTD
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