Method and device for generating binaural pin defect sample based on generative adversarial network
A defect and network technology, applied in the field of double-ear pin defect sample generation, can solve problems such as difficulty in adapting to high-speed, accurate and automatic detection, loose catenary components, hidden dangers of train safety operation, etc., and achieve good training results
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[0026] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention more clear, the embodiments of the present invention will be further described in detail below in conjunction with the accompanying drawings. Here, the exemplary embodiments and descriptions of the present invention are used to explain the present invention, but not to limit the present invention.
[0027] Figure 8 It is a schematic flowchart of a method for generating a double-eared pin defect sample based on a generative adversarial network in an embodiment of the present invention, as shown in Figure 8 As shown, the method includes the following steps:
[0028] Step 101: collecting a double ear pin sample image to obtain a double ear pin sample image data set; the double ear pin sample image data set includes a normal sample image data set and a defect sample image data set;
[0029] Step 102: Use the double ear pin sample image data set to train the cycle...
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