Test fixture and test assembly

Abstract

The disclosure provides a test fixture and a test assembly. The test fixture comprises a carrier, a plurality of groups of electric contact points and a plurality of electric wires. The carrier has a base and a frame extending along an upper surface of the base. The base and the frame define a first recess, a second recess extending longitudinally from the first recess, and a third recess extending laterally from the first recess. The plurality of groups of electric contact points are arranged on the base in a rotational symmetry manner, and the electric wires are electrically connected to the plurality of groups of electric contact points.

Description

technical field [0001] This disclosure claims priority and benefit to U.S. Formal Application No. 16 / 670,134, filed October 31, 2019, the contents of which are hereby incorporated by reference in their entirety. [0002] The disclosure relates to a carrier and an assembly, the carrier is used to support a device under test (DUT), and the assembly includes the carrier and the device under test. In particular, it relates to a test fixture and a component, the test fixture is used to support a printed circuit board mounted with a plurality of electronic components, the component includes the test fixture and the printed circuit board. Background technique [0003] Many placement, soldering, and other processing steps are required due to the components and populations of printed circuit boards. Therefore, testing and inspection are important parts for the economical manufacture of a high quality product. This is especially true when chip circuit density, input / output density, ...

AI Technical Summary

Problems solved by technology

These defects may themselves be incorrect values ​​or signs, poor circuit technology effects, opens, shorts, components in incorrect positions, physical damage, incorrect soldering, damage or open landings, or out of tolerance (out -of-tolerance) defects

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