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Test system and test method of electron multiplier

An electron multiplier and electronic testing technology, which is applied in the direction of instruments, measuring electronics, measuring devices, etc., can solve problems such as inability to test the electron multiplier, and achieve the effect of improving test efficiency

Pending Publication Date: 2021-05-07
BEIJING INST OF RADIO METROLOGY & MEASUREMENT
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The embodiment of the present disclosure provides a test system and test method for an electron multiplier to solve the technical problem that the prior art cannot provide an electron source and a cesium ion source to test the electron multiplier in the same vacuum environment

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  • Test system and test method of electron multiplier
  • Test system and test method of electron multiplier
  • Test system and test method of electron multiplier

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Embodiment Construction

[0028] In order to understand the characteristics and technical content of the embodiments of the present disclosure in more detail, the implementation of the embodiments of the present disclosure will be described in detail below in conjunction with the accompanying drawings. The attached drawings are only for reference and description, and are not intended to limit the embodiments of the present disclosure. In the following technical description, for purposes of explanation, numerous details are set forth in order to provide a thorough understanding of the disclosed embodiments. However, one or more embodiments may be practiced without these details. In other instances, well-known structures and devices may be shown simplified in order to simplify the drawings.

[0029] The terms "first", "second" and the like in the description and claims of the embodiments of the present disclosure and the above drawings are used to distinguish similar objects, and are not necessarily used...

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Abstract

The invention relates to the technical field of electron multipliers, and discloses a test system of an electron multiplier. The test system of the electron multiplier comprises a vacuum chamber, an electron test station, an ion test station and a movable target table, and the vacuum chamber is used for providing a vacuum environment for test; the electronic test station is arranged in the vacuum chamber; the ion test station is arranged in the vacuum chamber; and the movable target table is arranged in the vacuum chamber, is used for placing a tested electron multiplier, and can drag the tested electron multiplier to move between the electron test station and the ion test station. The test system of the electron multiplier can provide the electron source and the ion source to test the tested electron multiplier in the same vacuum environment, so that the test efficiency is improved. The embodiment of the invention further provides a test method of the electron multiplier.

Description

technical field [0001] The present application relates to the technical field of electron multipliers, for example, to a testing system and testing method for electron multipliers. Background technique [0002] The cesium atomic clock plays an important role in the fields of navigation and positioning, punctuality and timing. The electron multiplier is the core component of the cesium atomic clock, and its performance directly affects the overall performance of the cesium clock. At present, the electron multiplier test device mainly uses the electron source as the incident source, and the electron multiplier cannot be tested by providing the electron source and the cesium ion source in the same vacuum environment. Contents of the invention [0003] In order to provide a basic understanding of some aspects of the disclosed embodiments, a brief summary is presented below. The summary is not intended to be an extensive overview nor to identify key / important elements or to de...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 王运佳王一非刘国栋高连山王亮
Owner BEIJING INST OF RADIO METROLOGY & MEASUREMENT