Test system, transmitter and receiver for performing various tests

Abstract

The invention relates to a test system, a transmitter and a receiver for performing various tests. The test system comprises a transmitter, a receiver, a measuring circuit and a control circuit. The transmitter is coupled to the receiver in a direct current coupling manner, and comprises a signal input circuit for determining an output signal according to an input signal, a current source which is coupled between the signal input circuit and a low power supply end and is used for determining total current flowing through the signal input circuit under the condition of no open short circuit, and a signal output line for outputting the output signal for performance testing. The receiver includes an impedance circuit coupled to the signal output line, and a coupling circuit for coupling an impedance circuit to a high power supply end. The measuring circuit is used for measuring target current / voltage between the high power supply end and the low power supply end so as to generate a measuring result. The control circuit is used for judging whether a device to be measured is in the open-short-circuit-free condition or not according to the measuring result, and the device to be measured is the transmitter or the receiver.

Description

technical field [0001] The present invention relates to a test system, a transmitter and a receiver capable of performing various tests, and more particularly to a test system, a transmitter and a receiver capable of performing various tests in a DC-coupled mode. Background technique [0002] High-speed signal transmission is usually based on a DC coupling (DC coupling) architecture or an AC coupling (AC coupling) architecture. In a DC-coupled architecture, the transmitter and receiver are directly connected; therefore, both DC and AC signals can be successfully transmitted in this architecture. Protocols using a DC-coupled architecture include a High Definition Multimedia Interface (HDMI) protocol. [0003] figure 1 A conventional test system is shown for testing a transmitter in a DC-coupled configuration. figure 1 The test system 100 includes a device under test (DUT) 110 (i.e. transmitter), a multiplexer 120, a performance test unit (i.e. receiver) 130 and an open-sho...

AI Technical Summary

Problems solved by technology

[0006] (1) As the speed of signal transmission becomes faster and faster, it becomes more and more difficult to find a suitable multi-tasker

[0007] (2) The multiplexer itself will cause additional signal loss or reflection, which will degrade the test environment and lead to a decrease in product yield

[0008] It is worth noting that without using a multitasker, figure 1 The test system 100 of the test system will be divided into two systems to perform the transmission function test and the open circuit / short circuit test respectively, figure 2 The test system 200 of the test system will be divided into two systems to perform the receiving function test and the open circuit / short circuit test respectively, so that the test will increase and the test time will become longer, so that the test cost will increase

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