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Method for improving spatial resolution of ofdr measurement and ofdr system

A technology for spatial resolution and position measurement, applied in radio wave measurement systems, measurement devices, electromagnetic wave re-radiation, etc., can solve problems such as inability to realize micron-level detection and limited measurement resolution of OFDR systems, so as to improve hardware performance, Effects of Improving Measurement Spatial Resolution

Active Publication Date: 2021-08-10
武汉昊衡科技有限公司
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Problems solved by technology

[0004] The present invention aims at the problem that the existing OFDR system has limited measurement resolution and cannot realize micron-level detection, and provides a method that can effectively improve the spatial resolution of OFDR measurement

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  • Method for improving spatial resolution of ofdr measurement and ofdr system
  • Method for improving spatial resolution of ofdr measurement and ofdr system
  • Method for improving spatial resolution of ofdr measurement and ofdr system

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Embodiment Construction

[0037] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0038] The optical frequency domain reflectometry system (OFDR system) used in the embodiment of the present invention is as follows figure 1 As shown, the OFDR system includes a linear sweep laser 1 , a fiber beam splitter 2 , a main interferometer, an auxiliary interferometer, a first photodetector 10 , a second photodetector 11 , a data acquisition card 12 and a processor 13 .

[0039] Among them, the linear frequency sweep laser 1 sets the frequency sweep range sequentially according to the preset frequency sweep range; the preset scan range is based on the spatial resolution , , ,..., ...

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Abstract

The invention discloses a method for improving the spatial resolution of OFDR measurement. The method obtains the precise position of the event point through the two-sided clamping method, specifically: setting the frequency sweep range of the light source to the widest, and obtaining the optical fiber link event to be tested The location of the point; change the frequency sweep range of the OFDR system to obtain the location information of the event point under different measurement spatial resolutions; conduct an inductive analysis of the location information of multiple measurements, and obtain the precise location of the event point by the two-sided clamping method. The mutual complementarity of measurement results at adjacent spatial resolutions is equivalent to refining the distance between measurement points, thereby effectively improving the measurement spatial resolution. The invention does not need to improve the system hardware performance, and can improve the measurement space resolution of the OFDR system only through multiple measurements and inductive analysis, which is simple and easy to implement.

Description

technical field [0001] The invention relates to the field of optical fiber sensing and measurement, in particular to a method for improving the spatial resolution of OFDR measurement and an OFDR system. Background technique [0002] Optical Frequency Domain Reflectometry (OFDR) is an advanced optical fiber sensing technology based on optical heterodyne detection and frequency domain analysis. Event positioning such as breakpoints, length, distributed insertion loss and spectrum measurement. In terms of fault location and length measurement, the well-developed optical time domain reflectometry technology is limited by the contradiction between the detection light pulse width and the spatial resolution and dynamic range, and the spatial resolution can only reach the meter level. The optical frequency domain reflectometry technology has effectively broken through the above limitations, and has the characteristics of high spatial resolution, large dynamic range, and high measur...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01D5/353G01S17/34
CPCG01D5/35306G01S17/34
Inventor 王辉文刘晓平张晓磊温永强张晓乔
Owner 武汉昊衡科技有限公司
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