Thz measuring device and thz measuring method for determining defects in measuring objects

Abstract

The invention relates to a preferably portable THz measuring device (1) for determining defects (3) in an measuring object (2), in particular a stationary measuring object, wherein the THz measuring device (1) comprises the following: an antenna array (4) having at least one active THz transmitter, for example transceiver (12), which sends out a THz transmission beam (15) along an optical axis (A), and a plurality of THz receivers (14), which are arranged under a fixed spatial arrangement with respect to the THz transmitter (12) and are synchronized with the THz receiver, detect reflected THz radiation (16) and send out THz measuring signals (S1), a control unit (5) that receives the THz measuring signals (S1) and determines defects (3) as reflections, which occurred outside correct boundary surfaces (2a, 2b) of the measuring object (2). To this end, the THz receivers (14) can also transmit intermittently, in particular alternately. The user can adjust the measuring device, wherein the position can be determined by an acceleration sensor (18) and temporal integration in order to obtain further measurement data.

Description

technical field [0001] The present invention relates to a THz measurement device and a THz measurement method for determining defects in a measurement object. Such measuring objects can be produced in particular from plastic, but also from other materials which are in principle transparent to THz radiation, such as ceramics, concrete or paper. In particular, defects can be shrinkage cavities, that is to say cavities formed during production, but also cracks, fissures, and inclusions, which can be made of another material, such as metal fragments. Background technique [0002] During the THz determination (Vermessung) of a measurement object, THz radiation (especially electromagnetic radiation in the frequency range of 0.01-10 THz) is emitted by the THz transceiver to the measurement object; the emitted electromagnetic radiation is therefore especially Also possible in the microwave range. The THz radiation impinging on the measurement object is partially reflected at bound...

AI Technical Summary

Problems solved by technology

However, generally with such stationary THz measuring devices it is almost impossible to prove defects on stationary measuring objects (e.g. also material fatigue and cracks)

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