A board defect area extraction method and device
An extraction method and an extraction device technology, which are applied in the field of extraction of defect areas on board surfaces, can solve problems such as the inability to meet the running speed of a production line, increase in missed detection rate and false detection rate, and long calculation time, so as to save the time required for detection, The effect of reducing time and improving accuracy
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Embodiment 1
[0057]Such asfigure 1 As shown, the present embodiment provides a method of extraction of a panel defect area, including:
[0058]Gets the board surface image to be detected and split, resulting in multiple detection units;
[0059]Gets the gradation threshold corresponding to the plurality of detection units;
[0060]The gradation mean value of the detecting unit is calculated and compared to the corresponding gradation threshold, determines whether or not the deficiencies in the detecting unit are included.
[0061]In the above scheme, by dividing the panel surface image to be detected into a plurality of detection units, the accuracy of the determination result is improved for each detection unit for each detecting unit, which has a corresponding gradation threshold for judging whether or not it contains defects. . At the same time, all the detection units containing the defects constitute the defective area on the panel, and the subsequent defects can be further identified, that is, the def...
Embodiment 2
[0096]Such asimage 3As shown, the present embodiment provides an extraction device of a plate surface defect region for achieving an extraction method of a panel defect region according to an embodiment described above. The extraction device of the panel defect area includes:
[0097]The image processing module is used to segment the board surface image to obtain multiple detection units;
[0098]The analysis module is connected to the image processing module, and the gradation mean for calculating the detection unit is calculated and compared to the acquired gradation threshold, determining whether the detection unit contains defects.
[0099]Further, the grayscale threshold includes a high threshold and a low threshold, and the extraction device of the panel defect area further includes a training module.
[0100]The training module is connected to the analysis module to obtain a high threshold TH_L [I] [J] and low threshold TH_L [I] [J] and low threshold TH_H [I] [J] and low thresholds. TH_L...
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