Fault injection circuit for super-large-scale integrated circuit

Abstract

The invention discloses a fault injection circuit for a super-large-scale integrated circuit, and belongs to the technical field of basic electronic circuits. The circuit comprises a fault injection module and a fault injection state machine module. The fault injection module comprises fault data generation, fault injection object selection and time division multiplexing logic, and the fault data generation is that a lookup table and a data selector are added to triggers, and different fault data are generated according to fault types; the selection of the fault injection objects is that unique ID numbers are distributed to all triggers in the circuit in sequence, and then a specific trigger injection fault is selected by analyzing the ID through a decoding circuit; the time division multiplexing logic is mainly used for dividing time into a fault injection part and a normal work part; the fault injection state machine is mainly used for controlling a fault injection process according to fault injection parameters so as to simulate a single event effect; when the circuit is implemented on the Zynq-7000 SoC, a fault injection mechanism can be optimized through interaction of the PS and the PL, and the fault injection speed is increased.

Description

technical field [0001] The invention relates to the reliability of integrated circuits and the fields of aerospace and aerospace, mainly relates to the research of single event effect-oriented fault injection technology, specifically discloses a fault injection circuit oriented to ultra-large-scale integrated circuits, and belongs to the technical field of basic electronic circuits. Background technique [0002] With the development of manufacturing technology, the feature size of integrated circuits is gradually reduced, and the energy threshold required to change the working state of the circuit is geometrically decreasing, which makes integrated circuits more susceptible to radiation exposure. Various radiation sources existing in the cosmic environment are very easy to induce working errors in integrated circuits. One of the effects of irradiation on integrated circuits is called the single event upset (Single Event Upset, SEU) effect, which is mainly manifested as bit f...

AI Technical Summary

Problems solved by technology

This type of method is implemented based on the internal dedicated port of the FPGA, without additional resource overhead, but the reconfiguration function is highly dependent on the support of the FPGA hardware, and the time consumed by the bit file configuration of the FPGA can easily become the bottleneck of the fault injection speed

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