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High repetition frequency X-ray free electron laser monopulse wavefront detector

A wavefront detector and X-ray technology, used in X/γ/cosmic radiation measurement, radiation measurement, instruments, etc. Problems such as cost and acquisition speed of limited area array detectors

Inactive Publication Date: 2021-05-28
SHANGHAI TECH UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

There have been many related schemes and experimental results for single-pulse wavefront detection of low-repetition free-electron lasers (1-100 Hz), and there are related experiments and methods for accumulated wavefront detection at high repetition rates. Pulse measurement is limited by the cost and acquisition speed of area array detectors, and there has been no reasonable solution
The patented X-ray free electron laser single-pulse damage-resistant wavefront detection and correction system (application number: 202010429379.3) that I applied for can collect single-pulse wavefront information at low repetition rate, or accumulate wavefront information for X-ray free electron laser Measurement, limited by the acquisition capability and data transmission capability of the area array detector, it is difficult to achieve continuous measurement of high repetition rate single pulse

Method used

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  • High repetition frequency X-ray free electron laser monopulse wavefront detector
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  • High repetition frequency X-ray free electron laser monopulse wavefront detector

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Embodiment 1

[0036] Such as figure 1 As shown, a high repetition rate X-ray free electron laser single-pulse wavefront detector disclosed in this embodiment includes a damage-resistant cross bidirectional grating 2, a grating adjustment system 3, a damage-resistant scintillator 4, a perforated mirror 5, and a package Body 6 (used to package damage-resistant scintillator and perforated mirror), package support 7, absorber 8, vacuum cavity 9, vacuum isolation window 10, long working distance objective lens 11, attenuation plate 12, visible light beam splitter 13 , two sets of high-speed linear array or multi-line detector components 14, an overall observation adjustment system 15, and a data acquisition and processing system 16. in:

[0037] The damage-resistant cross bidirectional grating 2 is a grating with two scribe lines perpendicular to each other etched on the damage-resistant material, the grating period is determined by the wavelength of the X-ray free electron laser 1 to be measur...

Embodiment 2

[0052] Such as figure 2 As shown, the difference between a high repetition rate X-ray free electron laser single pulse wavefront detector disclosed in this embodiment and embodiment 1 is that the long working distance objective lens 11 is replaced by a total reflection objective lens 11a with a hole in the center, placed in The visible light fluorescence of the damage-resistant scintillator 4 is directly received in the vacuum cavity 9, and then deflected at 90° by the perforated mirror 5 to pass through the vacuum isolation window 10 to the outside of the vacuum, and then pass through the attenuator 12, the visible light beam splitter 13, and two sets of high-speed lines. Array or multi-line detector 14, three-dimensional electric adjustment system 15, data acquisition and processing system 16. The advantage of this method is that the total reflection objective lens 11a has a larger numerical aperture and a higher resolution.

[0053] The total reflection objective lens 11a...

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Abstract

The invention relates to a high repetition frequency X-ray free electron laser monopulse wavefront detector which is characterized by comprising a damage-resistant cross bidirectional grating, a grating adjusting system, a damage-resistant scintillator, a perforated reflector, a vacuum isolation window, a long-working-distance objective lens or a total-reflection objective lens with a hole in the center, an attenuation piece, a visible light beam splitter, an absorber, two sets of high-speed linear arrays or multi-line detectors and a data acquisition and processing system. Monopulse wavefront information of the high repetition frequency free electron laser can be obtained.

Description

technical field [0001] The invention relates to a high repetition frequency X-ray free electron laser single pulse wavefront detector. Background technique [0002] High repetition rate X-ray free electron laser (XFEL) has the characteristics of high brightness, high coherence, ultra-short pulse, and high repetition rate, and is a powerful tool for basic scientific research. Therefore, developed countries in Europe and the United States are building high repetition rate X-ray free electron lasers. laser. A free electron laser experiment usually obtains one experimental data with a single pulse, while a high repetition frequency (10-1000kHz) X-ray free electron laser means that 10,000 to 1,000,000 experimental data can be obtained per second, which will bring new opportunities to basic scientific research. Come revolutionary tool. However, the current high repetition rate X-ray free electron laser also has some shortcomings, such as the specificity of each pulse, which is d...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01T1/202G01T1/29
CPCG01T1/2023G01T1/2914G01T1/2002
Inventor 佟亚军谢明涵江怀东范家东
Owner SHANGHAI TECH UNIV