An X-ray energy spectrum combined measurement spectrometer and its realization method

Abstract

The invention discloses an X-ray energy spectrum joint measurement spectrometer, which is used for measuring X-ray energy spectrum in the same orientation by combining a crystal diffraction method and a filter stacking method, and includes radiation shielding modules coaxially installed in a shielding shell sequentially from front to back , a crystal diffraction spectrometry module and a filter stack spectrometry module, and an aiming assembly for alignment. The invention combines two spectral measurement methods of crystal diffraction and filter attenuation, solves the technical problem that the existing technology cannot realize high precision and large range at the same time, realizes high precision and large range energy spectrum measurement in a single viewing angle, and can be used for Energy spectrum data from keV to MeV for diagnostic laser X-ray sources, X-ray tube sources, etc. The invention has the advantages of large spectrum measurement range, high energy spectrum resolution, anti-fragment impact, anti-plasma splashing, small space occupation solid angle, wide application range and the like.

Description

technical field [0001] The invention relates to the technical field of X-ray energy spectrum measurement, in particular, to an X-ray energy spectrum joint measurement spectrometer and a realization method thereof. Background technique [0002] Since its discovery, X-rays have been widely used in many fields such as industry, agriculture, and medical care, and have played an important role in scientific research and national economy and people's livelihood. At present, the main commonly used X-ray devices include: radioactive sources, X-ray machines, accelerator X-ray light sources, and the like. With the continuous progress of strong laser technology, the use of strong laser drive can generate X-rays in a variety of ways, which has become a new way of X-ray generation. The radioactive source produces X-rays with relatively simple energy spectrum characteristics, and the rest of the methods are based on the interaction between electron beams and matter. The X-ray energy spec...

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Problems solved by technology

Semiconductor-based detectors are common energy spectrum detectors, but limited by the sampling frequency of electronics, they cannot be used for ultra-high count rate X-ray sources, such as laser X-ray sources, etc.

The crystal spectrometer based on crystal diffraction spectroscopy has high energy spectrum resolution, but limited by the crystal diffraction angle and diffraction efficiency, its spectrum measurement range is relatively narrow, usually from a few keV to hundreds of keV

Spectrum diagnostic techniques based on the filter method include filter stacks, fan-shaped filters, and use filters and time-integrated recording media to measure gamma-ray energy spectra, but the accuracy of the filter method is too low for fine spectral line structures Measurement

At present, the X-ray energy spectrum measurement equipment based on the above-mentioned measurement principle is all discrete equipment. In order to simultaneously measure the characteristic spectral lines of the X-ray source with fine structure and the bremsstrahlung radiation in a wide energy range, it is necessary to install multiple sets of equipment, and the required diagnostic three-dimensional The angle is large, the measurement orientation of each equipment is inconsistent, and it is difficult to obtain the accurate spectrum of the anisotropic X-ray source

For the new X-ray source produced by laser targeting, a large number of high-energy electrons, protons, heavy ions and other rays generated at the same time will seriously interfere with the X-ray energy spectrum measurement, which increases the difficulty of accurately measuring the X-ray energy spectrum

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