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Memory device having fault detection functionality and control system including the same

A storage device and storage block technology, applied in the field of control systems

Pending Publication Date: 2021-06-08
SAMSUNG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Because the main functional parameters of the memory device are tested in the wafer level of the integrated circuit (IC) before the memory device is installed in the car, it is limited to test whether the memory device is functioning properly after the memory device is installed in the car and / or there is a chance of failure

Method used

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  • Memory device having fault detection functionality and control system including the same
  • Memory device having fault detection functionality and control system including the same
  • Memory device having fault detection functionality and control system including the same

Examples

Experimental program
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Embodiment Construction

[0018] figure 1 is a diagram describing an automotive electronic system according to an example embodiment of the present disclosure.

[0019] refer to figure 1 , the automotive electronic system 100 may be composed of a plurality of functional elements included in an automobile, and includes a control system 110 and a plurality of electronic devices 120 . The control system 110 may be connected to and communicate with the electronic device 120 through an in-vehicle network. The in-vehicle network may be a Controller Area Network (CAN), a FlexRay-based network, a Media-Oriented System Transport (MOST)-based network, and the like. In some embodiments, the control system 110 may be connected to and communicate with the electronic device 120 through an external communication network. External communication networks may include a personal area network (PAN) such as a Bluetooth network, a local area network (LAN) such as an 802.11xWiFi network, and / or a wide area network (WAN) s...

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Abstract

A memory device having fault detection functionality for improving functional safety and a control system including the memory device are provided. The memory device includes a first memory cell array configured to store input data and output the input data as output data and a second memory cell array configured to store bit values of a row address and a column address of the first memory cell array in which the input data is stored, and output the bit values of the row address and the column address as an internal row address and an internal column address. The row / column address designating a read operation may be compared to the internal row / column address, and an address comparison signal as a result of the comparison may be output. The address comparison signal may provide fault detection functionality for a data error of an automotive electronic system.

Description

[0001] Cross References to Related Applications [0002] This application claims the benefit of Korean Patent Application No. 10-2019-0161671 filed with the Korean Intellectual Property Office on December 6, 2019, the disclosure of which is hereby incorporated by reference in its entirety. technical field [0003] The present disclosure relates to a memory device, and more particularly, to a memory device capable of improving functional safety by performing a fault detection function used by an automotive electronic system, and a control system including the same. Background technique [0004] Unlike devices used in general electronic products, failure of electronic devices (eg, electronic control units) mounted on automobiles may pose a fatal risk to the safety of the automobile in some cases. As the portion of electronic equipment in automobiles increases, electronic equipment for automobiles requires functional safety as an important factor. Functional safety means that ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/30G11C11/418G11C11/419
CPCG06F11/3037G11C11/418G11C11/419G11C7/1006G11C29/42G11C29/44G11C2029/1204G11C2029/1206G11C7/1051G11C8/08G11C29/006G11C29/18G11C11/4085G11C11/4087G11C11/4094
Inventor 宋政学李灿昊李炷昌崔泰敏
Owner SAMSUNG ELECTRONICS CO LTD