Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Temperature measurement method of divertor target plate of tokamak device based on single-wave filtering

A tokamak and temperature measurement technology, applied in temperature recording, optical radiation measurement, radiation pyrometry, etc., can solve the problems of inability to quickly respond to target temperature changes, no tokamak device, etc., and achieve fitting results Accurate and improve the effect of temperature measurement accuracy

Active Publication Date: 2022-07-26
HEFEI UNIV OF TECH
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The existing thermocouple contact temperature measurement cannot quickly respond to the temperature change of the target. The emissivity of the target used in the non-contact infrared temperature measurement will be affected by many aspects. Taking tungsten as the main material of the divertor target plate as an example, there is currently no There is no emissivity value fully applicable to the temperature measurement of the tokamak device

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Temperature measurement method of divertor target plate of tokamak device based on single-wave filtering
  • Temperature measurement method of divertor target plate of tokamak device based on single-wave filtering
  • Temperature measurement method of divertor target plate of tokamak device based on single-wave filtering

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0108] (1) First follow figure 1 As shown, an infrared narrow-band filter with a center wavelength of 10200nm and a bandwidth of 100nm is installed in front of the infrared thermal imager lens. One end of the special light path is connected to the window of the tokamak device, and the other end is connected to the infrared filter, so that the radiation inside the tokamak device can enter the special light path from the window, and the radiation that can pass through the filter will be measured by the thermal imager to and displayed on the control software interface in the form of a grayscale image.

[0109] (2) The infrared thermal imager is connected to the industrial computer through a gigabit network cable. The industrial computer controls all operations of the infrared thermal imager. Set the emissivity to 1 in the thermal imager control software on the industrial computer, and read the collected The gray value of a point in the image can calculate the radiation value of ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for measuring the temperature of a divertor target plate of a tokamak device based on single-wave filtering, and relates to the technical field of infrared temperature measurement and magnetic confinement nuclear fusion. The radiant energy measured by the thermal imager is at the wavelength λ 0 The relational expression under the 0 The relationship between the temperature of the lower divertor target plate and the emissivity, and finally use the gray value of the image measured by the thermal imager during the discharge process of the tokamak device to calculate the real temperature of the divertor target plate at this time; the present invention uses a single The wave filter reduces the influence of the wavelength range on the temperature measurement accuracy, and also takes into account the transmittance of the filter, the attenuation of radiation in the special optical path, and the different temperature conditions of the tokamak device. The relationship between combined temperature and emissivity is more accurate than the linear model and the constant model.

Description

Technical field: [0001] The invention relates to the technical field of infrared temperature measurement and magnetic confinement nuclear fusion, in particular to a method for measuring the temperature of a target plate of a divertor of a tokamak device based on single-wave filtering. Background technique: [0002] The energy problem is a challenge to the economic and social development of various countries. The development of clean energy and the use of nuclear fusion technology to improve energy efficiency are urgent requirements of today's society. The tokamak device includes an annular container that uses magnetic confinement to achieve controlled nuclear fusion, and subsystems such as cryogenics, vacuum, water cooling, power supply and control, data acquisition and processing, wave heating, wave-driven current, and diagnostics. [0003] The use of non-contact thermometry to measure and diagnose the temperature of the first wall of a tokamak has been an active area of ​​...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01J5/53G01J5/48
CPCG01J5/53
Inventor 舒双宝王子艺赖金张育中郎贤礼陈晶晶
Owner HEFEI UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com