Method and system for preventing chip from entering test mode by mistake

Abstract

The invention relates to the field of chip testing, in particular to a method and system for preventing a chip from entering a testing mode by mistake. The method comprises the following steps: S1, presetting an import code pattern corresponding to a test mode; S2, acquiring a first signal received by the first pin; and S3, processing the first signal, judging whether the processed first signal belongs to the import code pattern or not, and controlling the chip to enter a test mode according to a judgment result. The technical scheme has the beneficial effects that the method and the system for preventing the chip from entering the test mode by mistake are provided, the chip can be accurately and quickly controlled to enter the test mode, and the situation that normal work of the chip is influenced due to the fact that the chip enters the test mode due to misoperation of a user is avoided.

Description

technical field [0001] The invention relates to the field of chip testing, in particular to a method and system for preventing a chip from entering a testing mode by mistake. Background technique [0002] IC (Integrated Circuit, chip), also known as integrated circuit, is a kind of microelectronic device or component. Through a certain process, components such as transistors, resistors, capacitors, and inductors required in a circuit are interconnected together to make On a small or several small semiconductor wafers or dielectric substrates, and then packaged in a package, it becomes a microstructure with the required circuit functions. The operation mode of the chip can usually be divided into work mode and test mode. Among them, the work mode is the normal operation mode of the chip. For general users, they usually work in the work mode; Finally, the test mode is carried out on the ATE (Automatic Test Equipment, automatic test equipment) machine. Realize the running tes...

AI Technical Summary

Problems solved by technology

[0003] These two modes are mutually exclusive. When the chip is in the test mode, it cannot perform the predetermined functions in the working mode. Therefore, users usually do not want the chip to enter the test mode by mistake.

However, in the prior art, due to the complexity of the mode setting interface of the chip, the chip often enters the test mode due to user misoperation or deliberate factors, making the chip unable to work normally, and even causing security problems.

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