Method and system for preventing chip from entering test mode by mistake
A test mode and chip technology, which is applied in the direction of electronic circuit testing, measuring electricity, measuring devices, etc., can solve problems such as safety problems, chips entering the test mode by mistake, and chips not working properly, etc.
Pending Publication Date: 2021-07-20
SUZHOU MOTORCOMM ELECTRONICS TECH CO LTD
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Problems solved by technology
[0003] These two modes are mutually exclusive. When the chip is in the test mode, it cannot perform the predetermined functions in the working mode. Therefore, users usually do not want the chip to enter the test mode by mistake.
However, in the prior art, due to the complexity of the mode setting interface of the chip, the chip often enters the test mode due to user misoperation or deliberate factors, making the chip unable to work normally, and even causing security problems.
Method used
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Embodiment
[0087] This embodiment is an embodiment of a specific application of the system for preventing the chip from accidentally entering the test mode, where the effective level is 0 level.
[0088] The preset module presets the imported pattern corresponding to the test mode. The data structure of the imported pattern can include 18 bytes of data, among which, the 0th to 15th bytes can correspond to the imported part, which can be "01011001_01010100", The 16th to 17th bytes can correspond to the configuration part in the signal, as shown in Table 1 below:
[0089]
[0090] Table 1
[0091] The reset pin of the chip receives the first signal Reset_n, the clock pin receives the clock signal test_clock, the debounce unit in the control module performs debounce processing on the first signal Reset_n, and generates the second signal Internal_reset_n, and the control unit generates the second signal Internal_reset_n according to the first signal Reset_n, The clock signal test_clock a...
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The invention relates to the field of chip testing, in particular to a method and system for preventing a chip from entering a testing mode by mistake. The method comprises the following steps: S1, presetting an import code pattern corresponding to a test mode; S2, acquiring a first signal received by the first pin; and S3, processing the first signal, judging whether the processed first signal belongs to the import code pattern or not, and controlling the chip to enter a test mode according to a judgment result. The technical scheme has the beneficial effects that the method and the system for preventing the chip from entering the test mode by mistake are provided, the chip can be accurately and quickly controlled to enter the test mode, and the situation that normal work of the chip is influenced due to the fact that the chip enters the test mode due to misoperation of a user is avoided.
Description
technical field [0001] The invention relates to the field of chip testing, in particular to a method and system for preventing a chip from entering a testing mode by mistake. Background technique [0002] IC (Integrated Circuit, chip), also known as integrated circuit, is a kind of microelectronic device or component. Through a certain process, components such as transistors, resistors, capacitors, and inductors required in a circuit are interconnected together to make On a small or several small semiconductor wafers or dielectric substrates, and then packaged in a package, it becomes a microstructure with the required circuit functions. The operation mode of the chip can usually be divided into work mode and test mode. Among them, the work mode is the normal operation mode of the chip. For general users, they usually work in the work mode; Finally, the test mode is carried out on the ATE (Automatic Test Equipment, automatic test equipment) machine. Realize the running tes...
Claims
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IPC IPC(8): G01R31/28
CPCG01R31/2856
Inventor 张棪棪
Owner SUZHOU MOTORCOMM ELECTRONICS TECH CO LTD