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Test circuit, test equipment and test circuit test method

A technology for testing circuits and testing methods, which is applied in the field of testing and can solve problems such as low testing efficiency and affecting work efficiency

Inactive Publication Date: 2021-07-27
BEIJING HUAFENG TEST & CONTROL TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the existing test equipment has low test efficiency, which affects work efficiency

Method used

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  • Test circuit, test equipment and test circuit test method
  • Test circuit, test equipment and test circuit test method
  • Test circuit, test equipment and test circuit test method

Examples

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Embodiment Construction

[0043] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail through the following embodiments and in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to explain the present application, not to limit the present application.

[0044] The serial numbers assigned to components in this document, such as "first", "second", etc., are only used to distinguish the described objects, and do not have any sequence or technical meaning. The "connection" and "connection" mentioned in this application all include direct and indirect connection (connection) unless otherwise specified. In the description of this application, it should be understood that the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", The orientation or positional relationship indicated by "bottom"...

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Abstract

The embodiment of the invention provides a test circuit, test equipment and a test circuit test method. The test circuit comprises a power supply, a first switch, a second switch, an inductor, a diode and a test end. The first switch and the second switch are sequentially connected between the positive electrode and the negative electrode of the power supply in series. The first switch and the second switch are sequentially connected between the positive electrode and the negative electrode of the power supply in series. The inductor comprises a first end and a second end. The first end of the inductor is connected between the first switch and the second switch. And the cathode of the diode is connected to the positive electrode of the power supply. The anode of the diode is connected to the second end of the inductor. One end of the test end is connected with the second end of the inductor. And the other end of the test end is connected with the negative electrode of the power supply. And the test end is used for testing the IGBT chip to be tested.

Description

technical field [0001] The present application relates to the field of testing, in particular to a testing circuit, testing equipment and a testing method for testing the testing circuit. Background technique [0002] IGBT (Insulated Gate Bipolar Transistor) is an insulated gate bipolar transistor, which is a composite fully-controlled voltage-driven power semiconductor device composed of BJT (bipolar transistor) and MOS (insulated gate field effect transistor), and has a MOSFET The advantages of high input impedance and low conduction voltage drop of GTR. The saturation voltage of GTR is low, and the current carrying density is high, but the driving current is large. The driving power of MOSFET is small and the switching speed is fast, but the conduction voltage drop is large and the current carrying density is small. The IGBT combines the advantages of the above two devices, with low driving power and low saturation voltage. Therefore, insulated gate bipolar transistors...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26
CPCG01R31/2601G01R31/2608
Inventor 陈跃俊郝瑞庭
Owner BEIJING HUAFENG TEST & CONTROL TECH CO LTD