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Pinhole high-definition imaging device and pinhole imaging system

An imaging device and pinhole imaging technology, applied in the field of pinhole imaging, can solve the problems of destroying the spectral information of incident light and distortion of recorded information, and achieve the effects of reducing diffraction efficiency, weakening light intensity, and high imaging resolution

Active Publication Date: 2022-03-04
LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
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Problems solved by technology

[0004] When the x-ray energy is very strong, in order to protect the imaging equipment from being damaged, it is usually necessary to add a metal filter in front of the imaging equipment, but this method will destroy the spectral information of the incident light, resulting in distortion of the recorded information

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  • Pinhole high-definition imaging device and pinhole imaging system
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Embodiment Construction

[0021] The present invention will be further described below in conjunction with embodiment and accompanying drawing.

[0022] Such as figure 1 The pinhole high-definition imaging device shown is used in the field of pinhole imaging. For the convenience of description, the imaging device is referred to as a "pinhole screen" hereinafter.

[0023] The pinhole sieve includes a substrate 1 of metal or non-metallic material that is set to be opaque as required. There is a circular pinhole area 2 on the substrate 1. The diameter of the pinhole area 2 is on the order of ten microns, that is, 10~ In the interval of 100 microns, there are a large number of micro-nano holes 3 distributed in the pinhole area 2, and the pore diameters of the micro-nano holes 3 are basically the same, the range is on the order of hundreds of nanometers, and the number is preferably 1000-10000 to basically cover the pinholes area 2.

[0024] The micro-nano holes 3 adopt a quasi-random distribution in the ...

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Abstract

The invention discloses a pinhole high-definition imaging device, which comprises a substrate with a pinhole area, the diameter of the pinhole area is 10-100 microns, and there are micro-nano holes distributed in an asymmetric manner in the pinhole area. The diameter of the pores is on the order of hundreds of nanometers. By randomly distributing a large number of micro-nano holes in the pinhole, the diffraction of the pinhole can be suppressed, so that the final imaging resolution can be approximated to the description of geometric optics within a certain limit. Compared with the pinhole imaging with the same aperture, the present invention breaks through the limitation of the pinhole aperture by diffraction, and can make the pinhole smaller, so that the final imaging resolution is higher. Compared with traditional pinhole imaging, a large number of micro-nano holes reduce the diffraction efficiency of the system, and act as a neutral filter, which can weaken the light intensity of the incident light without changing the spectral information of the incident light to protect the imaging equipment. The invention also discloses a pinhole imaging system provided with the pinhole high-definition imaging device.

Description

technical field [0001] The invention relates to the technical field of pinhole imaging, in particular to a pinhole high-definition imaging device and a pinhole imaging system. Background technique [0002] Inertial confinement fusion is expected to become an effective way to cleanly utilize fusion energy in the future. It has important research value in the fields of people's livelihood, economy and military. The United States, China, Russia and other major countries have carried out a series of in-depth researches on laser inertial confinement fusion. [0003] In the research of laser inertial confinement fusion, in order to study the physical phenomena in the experiment, pinhole imaging is a commonly used X-ray imaging method. The pinhole camera and framing camera based on the principle of pinhole imaging are widely used in laser fusion research. Therefore, it is of great significance to improve the resolution of pinhole imaging. [0004] When the X-ray energy is very str...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G03B42/02G02B27/58
CPCG03B42/021G02B27/58
Inventor 王峰刘欣城理玉龙徐涛刘祥明魏惠月彭晓世关赞洋刘永刚任宽杨冬杨家敏江少恩何海恩
Owner LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
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