Large-view-field reference plane calibration method in optical deflection three-dimensional measurement

A reference plane and three-dimensional measurement technology, applied in image analysis, instruments, calculations, etc., can solve the problems of noise sensitivity, inability to meet the calibration requirements of large field of view reference planes, poor algorithm stability, etc., to achieve strong stability, high precision, The effect of good algorithm robustness

Active Publication Date: 2021-09-03
HEFEI UNIV OF TECH
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Problems solved by technology

However, these methods are sensitive to noise, have poor algorithm stability, and their calibration results are locally optimal.
It cannot meet the calibration requirements of the large field of view reference plane

Method used

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  • Large-view-field reference plane calibration method in optical deflection three-dimensional measurement
  • Large-view-field reference plane calibration method in optical deflection three-dimensional measurement
  • Large-view-field reference plane calibration method in optical deflection three-dimensional measurement

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Embodiment Construction

[0047] In the present invention, the large-field-of-view reference plane calibration method in the three-dimensional measurement of optical deflection is a pose calibration method between the camera and the large-field-of-view reference plane by using an auxiliary plane mirror. And it is applied in the calibration system composed of reference plane I, checkerboard calibration plate II, camera III, auxiliary plane mirror IV and optical platform V. In this embodiment, a large-format LCD display is used as a reference plane, and a checkerboard image is generated by a computer as a checkerboard calibration board.

[0048] Step 1, such as figure 1 As shown, a checkerboard calibration plate II is set at a certain position on the reference plane I;

[0049] Utilize the camera III to collect the mirror images of the checkerboard calibration plate II under the auxiliary plane mirror IV at different inclination angles, (the plane mirror can adjust the inclination angle 3 times: tilt ar...

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Abstract

The invention discloses a large-view-field reference plane calibration method in optical deflection three-dimensional measurement, and the method comprises the steps: firstly collecting a mirror image of a chessboard calibration plate on a reference plane, and determining the internal and external parameters of a camera through a Zhang Zhengyou calibration method; then determining external parameters from the reference plane to the camera through orthogonal constraint between mirror images of each group of calibration plates; and finally, adding coplane constraints between each group of calibration plates, and obtaining an optimal solution of external parameters between the camera and the reference plane by using an LM optimization method. According to the invention, the coplanarity constraint among the positions of a plurality of checkerboard calibration plates on the large-view-field reference plane is utilized to obtain the pose conversion parameters from the reference plane to the camera, so that the robustness and accuracy of the calibration method are improved.

Description

technical field [0001] The invention relates to the field of camera calibration, in particular to a calibration method from a large field of view reference plane to a camera. Background technique [0002] The deflection detection system for highly reflective surfaces is mainly composed of a reference plane, a camera and a mirror to be tested. Generally, a large-format LCD display is selected as the reference plane, and the computer controls the display to generate a coded image; the camera observes the reference plane through the surface to be tested, and uses the reentrant mirror characteristics of the high-reflective surface to collect the coded image modulated by the curvature change of the high-reflective surface. Demodulating the encoded image information restores the 3D shape of the mirror. [0003] Therefore, the calibration from the reference plane to the camera is one of the key technologies in the deflection measurement of highly reflective surfaces. Its main func...

Claims

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Application Information

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IPC IPC(8): G06T7/80
CPCG06T7/80
Inventor 卢荣胜邹志庭
Owner HEFEI UNIV OF TECH
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