Detection and maintenance integrated platform suitable for 32-bit MCU chip
A chip and platform technology, applied in the field of inspection and maintenance integrated platform, can solve problems such as increasing chip scrap rate and increasing production cost
Inactive Publication Date: 2021-09-10
合肥市华宇半导体有限公司
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[0003] According to the above, at present, after the MCU chip is produced and packaged, corresponding quality inspections will be carried out, one of which is to perform appearance inspection on the pin probes integrated on the chip. Simple infrared scanning cannot fix the damaged position on the basis of visual inspection and carry out targeted repair treatment according to the detection structure, so the scrap rate of chips is greatly improved and the production cost is enhanced.
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[0028] In the following text, numerous specific details are set forth in order to provide a thorough understanding of the concepts underlying the described embodiments, however, it will be apparent to those skilled in the art that the described embodiments can be used without these specific details. Some or all instances were practiced, and in other instances well-known process steps were not described in detail.
[0029] In describing the invention, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer ” and other indicated orientations or positional relationships are based on the orientations or positional relationships shown in the drawings, which are only for the convenience of describing the invention and simplifying the description, rather than indicating or implying that the referred device or element must have a specific orientation, use a specific Azimuth construction and operation, therefore, are no...
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The invention discloses a detection and maintenance integrated platform suitable for a 32-bit MCU chip, and the platform comprises a detection machine table, a maintenance cavity, a chain conveyor, a visual sensor, a sliding cavity, an electric push rod, a maintenance cover, a flow guide cavity, an electromagnetic valve, and a cooler. According to the detection and maintenance integrated platform suitable for the 32-bit MCU chip, firstly, the visual sensor can conduct visual detection on the pin probes on the surface of the chip, whether the pin probes are damaged or not is judged according to the light reflection principle, secondly, the electric push rod drives the maintenance cover to slide downwards along the sliding cavity, and the electromagnetic valve at the corresponding position is triggered to be opened according to the detection result. The metal solution can be guided downwards to the damaged position of the corresponding pin probe of the chip along the flow guide cavity so that the damaged position is repaired by the metal solution, finally, the cooler can refrigerate the surface of the chip below after repairing is completed, the metal solution is cooled and rapidly solidified, and finally the purpose of overhauling the chip is achieved.
Description
technical field [0001] The invention relates to the technical field of chip maintenance, in particular to an integrated detection and maintenance platform suitable for 32-bit MCU chips. Background technique [0002] Microcontroller Unit (MCU), also known as Single Chip Microcomputer (Single Chip Microcomputer) or single-chip microcomputer, is to appropriately reduce the frequency and specifications of the Central Processing Unit (Central Process Unit; CPU), and reduce the memory, Peripheral interfaces such as counter (Timer), USB, A / D conversion, UART, PLC, DMA, and even LCD drive circuits are integrated on a single chip to form a chip-level computer, which can be used for different combination controls for different applications. For example, mobile phones, PC peripherals, remote controls, automotive electronics, industrial stepping motors, control of robotic arms, etc., can all be seen with MCUs. [0003] According to the above, at present, after the MCU chip is produced ...
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IPC IPC(8): B01L3/00B01L7/00
CPCB01L3/5027B01L7/00
Inventor 彭勇朱娟娟刘天阳
Owner 合肥市华宇半导体有限公司