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Electrical test bench

A technology of electrical test and test bench, which is applied in the direction of cleaning method using gas flow, cleaning method and utensils, cleaning method using tools, etc., which can solve the problems of low efficiency, time-consuming and laborious, etc.

Active Publication Date: 2021-09-10
CHANGCHUN INST OF TECH +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The existing electrical test bench needs to ensure the cleanliness of the surface when it is used, so it needs to be wiped and other operations on a regular basis. Generally, the staff use a rag to clean and wipe it manually. Due to the relatively large area of ​​the test bench, manual cleaning is required. The efficiency will be relatively low. When the height of the staff is relatively low, the position far away from the staff cannot be reached. It is necessary to continuously move the position to complete the wiping of the entire test bench, which is time-consuming and laborious.

Method used

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Embodiment Construction

[0041] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. ", "back", "left", "right", "top", "bottom", "inner", "outer" and other indicated orientations or positional relationships are based on the orientations or positional relationships shown in the drawings, and are only In order to facilitate the description of the present application and simplify the description, it does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as limiting the present application.

[0042] see Figure 1 to Figure 3 , the present embodiment provides a kind of electrical test bench, comprises test bench 1, also includes:

[0043] A cleaning mechanism located on the test bench 1, the cleaning mechanism includes a du...

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Abstract

The embodiment of the invention discloses an electrical test bench, relates to the technical field of electrical equipment, and mainly aims to solve the problem that an existing commercial refrigeration device cannot automatically remove dust. The electrical test bench comprises a test bench, a cleaning mechanism, a storage part and a sliding assembly; a lifting mechanism in the storage part, a first driving mechanism in the cleaning mechanism and a limiting part and a transmission part in the sliding assembly are matched with each other, so that the cleaning mechanism can be automatically moved to the surface of the test bench; and the first driving mechanism can drive a dust removal assembly in the cleaning mechanism through the transmission part to roll back and forth on the surface of the test bench while removing dust on the surface, and after dust removal is completed, the cleaning mechanism can be driven to automatically enter the storage part to be hidden, so that the attractiveness of the test bed is not affected. The electrical test bench has the characteristics of the simple structure, the high automation degree and the high dust removal efficiency.

Description

technical field [0001] The application relates to the technical field of electrical equipment, in particular to an electrical test bench. Background technique [0002] The electrical test bench is a kind of power cabinet, workbench or box for electrical testing, and the testing bench contains relevant wires, sockets, switches and other structures for electrical testing. [0003] The existing electrical test bench needs to ensure the cleanliness of the surface when it is used, so it needs to be wiped and other operations on a regular basis. Generally, the staff use a rag to clean and wipe it manually. Due to the relatively large area of ​​the test bench, manual cleaning is required. The efficiency will be relatively low. When the height of the staff is relatively low, the position far away from the staff cannot be reached. It is necessary to continuously move the position to complete the wiping of the entire test bench, which is time-consuming and laborious. Contents of the...

Claims

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Application Information

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IPC IPC(8): B08B1/04B08B5/04B08B13/00
CPCB08B5/04B08B13/00B08B1/143B08B1/32
Inventor 张红纪秀王晖刘洋和思铭李林琳安喆
Owner CHANGCHUN INST OF TECH