A kind of silicon carbide crystal, the seed crystal used and the preparation method of the seed crystal

A silicon carbide seed and silicon carbide single crystal technology, applied in chemical instruments and methods, crystal growth, from chemically reactive gases, etc., can solve the problem that the coupling factors in the growth process are difficult to obtain, it is difficult to ensure the quality of silicon carbide crystals, and it is difficult to Obtain high-quality seed wafers and other issues to achieve the effect of ensuring crystal growth rate, small dislocation density, and small number of defects

Active Publication Date: 2022-07-12
SICC CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, due to the unbalanced ratio of growth materials in the above-mentioned seed crystal, it is difficult to obtain high-quality seed crystal wafers without macroscopic defects, and the efficiency is low. Each crystal ingot can only obtain one seed crystal; Optimizing the seed crystal growth on the a-plane, the cycle is very long and there are too many coupling factors in the growth process, so it is difficult to obtain high-quality seed crystals
[0005] In addition, due to the uncontrollable atomic step density of traditional seed crystals, defects such as polymorphism and dislocations are prone to occur during the growth process, and it is difficult to guarantee the quality of the subsequent growth of silicon carbide crystals

Method used

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  • A kind of silicon carbide crystal, the seed crystal used and the preparation method of the seed crystal
  • A kind of silicon carbide crystal, the seed crystal used and the preparation method of the seed crystal
  • A kind of silicon carbide crystal, the seed crystal used and the preparation method of the seed crystal

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Experimental program
Comparison scheme
Effect test

Embodiment 1

[0086] refer to figure 1 , this embodiment provides a preparation device for improving the quality of seed crystals, which includes: a processing chamber 11, a heating unit 12 and a loading unit; wherein, the processing chamber 11 is provided with a crucible 13, and the crucible 13 is used for holding raw materials The heating unit 12 is arranged on the periphery of the crucible 13, and is used to melt the raw material into a molten state component 14 and sublime to the seed crystal 1, so as to repair or reconstruct the atomic steps of the seed crystal growth surface; the upper edge of the heating unit 12 does not exceed the molten state. The liquid level of the component 14 in the molten state; the loading unit is used to load the seed crystal 1 so that the seed crystal 1 is located above the liquid level of the molten component 14 . By setting the upper edge of the heating unit 12 not to exceed the liquid level of the molten component 14, the heating unit 12 is prevented fro...

Embodiment 2

[0133] The preparation of embodiment 2 seed crystal

[0134] refer to Figures 1 to 3 , according to an embodiment of the present application, a method for preparing seed crystal 1 using the device of Example 1 includes the following steps:

[0135] 1) Loading: the seed crystal to be treated is fixed above the crucible, the inside of the crucible is loaded with raw materials, and the seed crystal 1 and the crucible are placed in the crystal processing chamber;

[0136] 2) Impurity removal: pump the pressure in the crystal processing chamber to 10 -6 Below mbar, feed the inert gas to 300~500mbar, and repeat this process at least twice;

[0137] 3) Preheating the seed crystal: Pump the pressure in the crystal processing chamber to 10 -6 Below mbar, and heat the raw materials in the crucible to melt the raw materials to form molten components, adjust the distance between the growth surface of the seed crystal and the liquid surface of the molten components to be 10-100 mm, and...

Embodiment 3

[0146] Example 3 Characterization of Seed Crystals

[0147] The seed crystal prepared in Example 2 was characterized, and its scratch condition, step state, doping concentration of doping elements, TTV value, BOW value, Warp value and defect density were tested. The test results are shown in Table 2. Elements are reactive elements other than carbon and silicon.

[0148] Table 2

[0149]

[0150]

[0151]

[0152] It can be seen from the above table that through the adjustment and combination of various conditions in this embodiment, the repair and reconstruction of the atomic steps on the growth surface of the silicon carbide seed crystal can be realized, and the step state can be freely controlled; in addition, the surface of the seed crystal can be adjusted. Scratches have a slight repairing effect; therefore, compared with traditional seed crystals, the seed crystal step information of the present application is complete, laying a foundation for the subsequent growt...

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Abstract

The present application discloses a silicon carbide crystal, a seed crystal used therefor and a method for preparing the seed crystal, belonging to the technical field of semiconductor materials. The silicon carbide seed crystal includes a first surface and a second surface opposite to the first surface, the first surface and / or the second surface has a plurality of atomic steps, and the width of the atomic steps is 50 ~1000 nm, the height of the atomic steps is 0.02-0.5 nm; the width difference between a plurality of the atomic steps is not more than 10 nm; and / or the height difference between the multiple atomic steps is not more than 0.01 nm. The atomic steps of the silicon carbide seed crystal are uniformly arranged, and the size of each step is uniform, which lays a foundation for subsequent growth to obtain ultra-high-quality crystals.

Description

technical field [0001] The present application relates to a silicon carbide crystal, a seed crystal used therefor and a method for preparing the seed crystal, and belongs to the technical field of semiconductor materials. Background technique [0002] As one of the important third-generation semiconductor materials, SiC crystal has excellent performance in high temperature, high frequency, high power, radiation resistance, etc. SiC-based devices have been widely used in military, civil, aerospace and other fields. Application is a key area of ​​scientific and technological research in various countries. [0003] At present, the most widely used method for growing silicon carbide crystals is the physical vapor transport method, followed by the liquid phase method and the chemical vapor transport method. When the above-mentioned growth method is used to prepare a high-quality silicon carbide substrate, a high-quality silicon carbide seed crystal is indispensable, that is, a s...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): C30B29/36C30B23/00C30B25/00
CPCC30B29/36C30B23/00C30B25/00
Inventor 张宁杨晓俐李加林刘星高超方帅石志强刘家朋
Owner SICC CO LTD
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