Method, system and device for measuring microstructure evolution of energetic material
A technology of microstructure evolution and measurement method, applied in the field of energetic materials, which can solve problems such as restricted static or quasi-static loading conditions, imperfect research on energetic materials, and inability to directly correspond to experimental data and actual physical processes.
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Embodiment 1
[0051] like figure 1As shown, this embodiment provides a method for measuring the microstructure evolution of energetic materials, including:
[0052] Step 101, acquiring a free surface velocity history curve of the energetic material; the free surface velocity history curve is obtained after the first laser beam irradiates the energetic material composite target. Specifically, the first laser beam is a nanosecond laser beam, and the energetic material composite target includes an energetic material; the nanosecond laser beam drives the energetic material composite target to generate a high temperature inside the energetic material High pressure state. While laser loading the energetic material, the free surface velocity history curve of the energetic material is obtained.
[0053] Step 102, acquiring the diffraction data of the energetic material; the diffraction data is obtained after the X-ray source irradiates the composite target of the energetic material, and the diffr...
Embodiment 2
[0063] like image 3 As shown, this embodiment provides a measurement system for microstructure evolution of energetic materials, including a free surface velocity history curve acquisition module 201 , a diffraction data acquisition module 202 and a microstructure evolution characteristic determination module 203 .
[0064] The free surface velocity history curve acquisition module 201 is used to acquire the free surface velocity history curve of the energetic material; the free surface velocity history curve is obtained after the first laser beam irradiates the energetic material composite target.
[0065] The diffraction data acquisition module 202 is used to acquire the diffraction data of the energetic material; the diffraction data is obtained after the X-ray source irradiates the composite target of the energetic material; the X-ray source is the composite backlight irradiated by the second laser beam obtained after the target.
[0066] The microstructure evolution cha...
Embodiment 3
[0072] like Figure 4 As shown, this embodiment provides a measurement device for the microstructure evolution of energetic materials, including a first laser source, a second laser source, a composite target for energetic materials, a composite backlight target 6, a diffraction data acquisition component, and a data processor; The data processor has a built-in measurement system for the microstructure evolution of energetic materials provided in Embodiment 2. The first laser source is used to emit a first laser beam 50 to the energetic material composite target; the second laser source is used to emit a second laser beam 51 to the composite backlight target 6 to generate an X-ray source, Wherein the composite backlight target 6 is arranged on the composite backlight target frame 7; the X-ray source is used to irradiate the energetic material composite target to carry out X-ray diffraction, which produces Figure 4 The X-ray diffraction cone 52 in the middle; the diffraction ...
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