Fault tree analysis method for S700K turnout switch machine
A technology of fault tree analysis and fault analysis, which is applied to measuring devices, instruments, short-circuit tests, etc., can solve the problems of low fault analysis efficiency and inability to find faults quickly and accurately, and achieve shortened troubleshooting time, high judgment accuracy, and analysis high efficiency effect
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[0028] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention.
[0029] refer to Figure 1-7 , a kind of fault tree analysis method of S700K turnout switch machine, comprises the following steps:
[0030] S1, forming a fault description through fault mode impact fault analysis;
[0031] S2. Combining the fault description formed in S1 with the fault history database of the system to form a fault diagnosis process database, the fault diagnosis process database at least includes fault manifestations and fault traceability;
[0032] S3, Fault tree analysis is performed on the basis of the fault diagnosis process database, thereby supplementing the cause of multi-point faults that lead to the failure of the switch machine. In this st...
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