Check patentability & draft patents in minutes with Patsnap Eureka AI!

Fault tree analysis method for S700K turnout switch machine

A technology of fault tree analysis and fault analysis, which is applied to measuring devices, instruments, short-circuit tests, etc., can solve the problems of low fault analysis efficiency and inability to find faults quickly and accurately, and achieve shortened troubleshooting time, high judgment accuracy, and analysis high efficiency effect

Pending Publication Date: 2021-09-17
合安高铁股份有限公司 +1
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to solve the defects of low fault analysis efficiency and the inability to quickly and accurately find the specific causes of system faults in the prior art, thereby proposing a fault tree analysis method for S700K turnout switch machine

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Fault tree analysis method for S700K turnout switch machine
  • Fault tree analysis method for S700K turnout switch machine
  • Fault tree analysis method for S700K turnout switch machine

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention.

[0029] refer to Figure 1-7 , a kind of fault tree analysis method of S700K turnout switch machine, comprises the following steps:

[0030] S1, forming a fault description through fault mode impact fault analysis;

[0031] S2. Combining the fault description formed in S1 with the fault history database of the system to form a fault diagnosis process database, the fault diagnosis process database at least includes fault manifestations and fault traceability;

[0032] S3, Fault tree analysis is performed on the basis of the fault diagnosis process database, thereby supplementing the cause of multi-point faults that lead to the failure of the switch machine. In this st...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a fault tree analysis method for an S700K turnout switch machine. The method comprises the following steps: S1, influencing fault analysis through a fault mode to form a fault description; S2, combining the fault description formed in the step S1 with a fault historical database of the system to form a fault diagnosis process database, wherein the fault diagnosis process database at least comprises fault performance and fault traceability; s3, carrying out fault tree analysis on the basis of the fault diagnosis process database, so that multi-point fault reasons causing faults of the turnout switch machine are supplemented; and S4, converting the fault tree into a fault analysis positioning tree, and positioning and analyzing the fault of the turnout switch machine through the fault analysis positioning tree. According to the method, the turnout fault of the switch machine of a specific switch machine type can be quickly obtained, the analysis efficiency is high, the judgment accuracy is high, and each machine type adopts a specific fault tree.

Description

technical field [0001] The invention relates to the technical field of switch machines, in particular to a fault tree analysis method for S700K switch machines. Background technique [0002] The switch machine comprehensive monitoring and acquisition sub-unit is responsible for collecting the display gap value of the switch machine, the operation video and the gap shaking amount, the passing car video and the gap shaking amount, the temperature and humidity in the switch machine box, the vibration acceleration and other parameters, and upload the measurement results to the indoor monitoring station for data analysis, data display and over-limit alarm to realize human-computer interaction. The overall structure of the system adopts CS structure. The monitoring software is divided into client and server. The client is mainly responsible for the data collected by the switch machine. The storage, display, and alarm and interaction functions related to the operator. The fault tre...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R31/54G01R31/52
CPCG01R31/00G01R31/54G01R31/52
Inventor 王栋刘勇志汤铁松王永芳张校平夏勇王洪涛李刚张丽娟王飞翔
Owner 合安高铁股份有限公司
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More