Chip performance test system and test method

Abstract

The invention discloses a chip performance test system and a test method. The chip performance test system comprises a chip clamp, a test board, a controller, and an imaging system, a direct current probe, a high frequency probe and an optical fiber which are respectively connected with the controller, the chip clamp is used for clamping a to-be-tested chip, and the chip clamp is placed on the test bench to carry out the performance test of the to-be-tested chip. The imaging system is positioned above the test board and is used for acquiring an image of the chip to be tested; when performance testing is carried out, the direct current probe, the high frequency probe and the optical fiber are in contact with a chip to be tested. And the controller determines a chip type according to a chip image returned by the imaging system, searches corresponding adjustment data according to the chip type, and performs position adjustment on the imaging system, the direct-current probe, the high-frequency probe and the optical fiber based on the adjustment data. According to the scheme, the devices do not need to be manually adjusted one by one, dependence on artificial experience is not needed, and the problems of low test efficiency, poor accuracy and the like of traditional adjustment can be solved.

Description

【Technical field】 [0001] The invention belongs to the technical field of optical communication, and more specifically relates to a chip performance testing system and testing method. 【Background technique】 [0002] With the growth of communication services, the bandwidth requirements of transmitting devices and receiving devices are getting higher and higher, ranging from 2.5Gb / s, 10Gb / s to 25Gb / s, 50Gb / s, and as the core raw material of optical devices , the high-frequency performance test of the light emitting chip and the light receiving chip is particularly important. In the traditional test method, it is usually necessary to put the chip to be tested on the test platform first, and then manually adjust each device of the test system. After the adjustment is completed, the high-frequency performance test of the chip to be tested is performed. For example, it is necessary to adjust the position of the camera in the test system so that the camera can accurately capture th...

AI Technical Summary

Problems solved by technology

[0005] In view of the above defects or improvement needs of the prior art, the present invention provides a chip performance testing system and testing method, the purpose of which is to efficiently and automatically complete the adjustment of each device in the testing system before performing the chip performance testing, thereby solving the problem of traditional Technical problems of low test efficiency and poor accuracy in the test plan

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