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Tree display and operation system and method for chip test data

A chip testing and operating system technology, which is applied in electrical digital data processing, natural language data processing, and detection of faulty computer hardware. , the effect of improving the speed of rendering

Active Publication Date: 2021-10-01
上海芷锐电子科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] The processing of chip test data has always relied on web technology or Excel for processing, but none of the above solutions can conveniently process hierarchical data
[0003] As the scale of the chip becomes larger and the number of test units reaches hundreds of millions, the above technologies are not suitable for processing such a large-scale data. At the same time, the chip test units are inherently related, and operations such as merging / splitting of data are required, so there is an urgent need A dedicated data processing and analysis tool to solve the problems encountered in the current chip test data analysis

Method used

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  • Tree display and operation system and method for chip test data
  • Tree display and operation system and method for chip test data

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Embodiment Construction

[0033] Embodiments of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0034] A tree display and operating system for chip test data, including a conversion module, an integration module, a tree structure construction module, a display module and a data operation module;

[0035] The conversion module is used for test unit format conversion, parsing the test unit and converting it from text format to tabular data;

[0036] The integration module is used for the integration of test unit data and test unit, and merges the data of each test unit into the test unit, and then converts it into binary data;

[0037] The tree structure construction module is used to analyze the tabular data and convert the tabular data into hierarchical tree data; since the tabular data already contains all the information used to build the tree structure, this construction module only A tree structure can be established as needed to ret...

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Abstract

The invention discloses a tree display and operation system and method for chip test data. The system comprises a conversion module for converting the format of a test unit; an integration module for integrating data of the test unit and the test unit; a tree structure construction module for analyzing table type data and converting the table type data into tree data with a hierarchical structure; a display module for adding data needing to be tracked to a waveform window; and a data operation module for operating the tree data needing to be operated. According to the invention, original text data is displayed according to a tree structure, the operation of a user can be responded in real time, massive data can be retrieved, a designed waveform window can be used for carrying out operations such as merging, splitting and system conversion on the data, and the problems that the data size of chip testing is large, the data is not visual and is difficult to track and compare are solved.

Description

technical field [0001] The invention belongs to the technical field of computer and chip testing, and in particular relates to a tree display and operating system and method of chip testing data. Background technique [0002] The processing of chip test data has always relied on web technology or Excel for processing, but none of the above solutions can conveniently process hierarchical data. [0003] As the scale of the chip becomes larger and the number of test units reaches hundreds of millions, the above technologies are not suitable for processing such a large-scale data. At the same time, the chip test units are inherently related, and operations such as merging / splitting of data are required, so there is an urgent need A special data processing and analysis tool solves the problems encountered in the current chip test data analysis. Contents of the invention [0004] The technical problem to be solved by the present invention is to provide a tree display and operat...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22G06F40/177
CPCG06F11/2236G06F40/177Y02D10/00
Inventor 郭希训于威刘圆牛沿笼孙怡乐石加圣
Owner 上海芷锐电子科技有限公司
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