Method and device for testing low-power state access time of solid state disk, computer equipment and storage medium

A technology of computer equipment and solid-state hard disk, which is applied in the field of testing the low-power consumption time of solid-state hard disk, which can solve the problems of inaccuracy and influence of solid-state hard disk, etc.

Pending Publication Date: 2021-10-01
SHENZHEN YILIAN INFORMATION SYST CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Notebook manufacturers have requirements for the time of entry and exit, and the time of entry and exit will affect the energy consumption of the SSD, which is an invisible important parameter; the existing low-power entry and exit time test methods include the following two: 1. Read through internal debugging tools The nominal entry and exit time value of the hard disk is compared with the actual entry and exit time, and the result is for reference only; 2. The time when the solid state disk executes the command after the host sends the low power state command through the software is relatively close to the actual entry and exit time , but there is still a difference with the low power consumption of the PCIe physical layer, which is not accurate enough

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  • Method and device for testing low-power state access time of solid state disk, computer equipment and storage medium
  • Method and device for testing low-power state access time of solid state disk, computer equipment and storage medium
  • Method and device for testing low-power state access time of solid state disk, computer equipment and storage medium

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Embodiment Construction

[0029] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0030] It should be understood that when used in this specification and the appended claims, the terms "comprising" and "comprises" indicate the presence of described features, integers, steps, operations, elements and / or components, but do not exclude one or Presence or addition of multiple other features, integers, steps, operations, elements, components and / or collections thereof.

[0031] It should also be understood that the terminology used ...

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Abstract

The invention relates to a method and device for testing the low-power state access time of a solid state disk, computer equipment and a storage medium. The method comprises the following steps of: issuing a command for entering a low-power state to a solid state disk; recording the power consumption value change of the solid state disk after the command is issued, and calculating the time required by the solid state disk to enter a low-power state; issuing a read-write command to the solid state disk to enable the solid state disk to exit from the low-power state; and recording the power consumption value change of the solid state disk exiting from the low-power state, and calculating the time required for the solid state disk to exit from the low-power state. The load power consumption value of the solid state disk is tested in real time after the host issues a low-power state access command, the duration of the solid state disk in the normal state and the low-power state is judged according to the change of the power consumption value, and then the time for entering and exiting from the low-power state is calculated, so that the time for the solid state disk to enter and exit from the low-power state can be accurately obtained. The method and the system are used for auxiliary analysis of host abnormity and excessive power consumption.

Description

technical field [0001] The invention relates to the technical field of testing the time of entering and exiting low power consumption of a solid-state hard disk, in particular to a method, a device, a computer device and a storage medium for testing the time of entering and exiting a low-power consumption of a solid-state hard disk. Background technique [0002] When the solid-state hard drive is working, it will switch the power supply mode according to the operating state of the notebook. When the notebook is left standing for a long time or in the sleep state, the solid-state hard drive will enter a low power consumption state. Notebook manufacturers have requirements for the time of entry and exit, and the time of entry and exit will affect the energy consumption of the SSD, which is an invisible important parameter; the existing low-power entry and exit time test methods include the following two: 1. Read through internal debugging tools The nominal entry and exit time ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22G06F11/30
CPCG06F11/2205G06F11/2273G06F11/3037G06F11/3062Y02D10/00
Inventor 许刘锐郭芳芳石骁
Owner SHENZHEN YILIAN INFORMATION SYST CO LTD
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