Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Point cloud registration strategy in flatness measurement of laser contourgraph

A laser profiler and point cloud registration technology, which is applied to measurement devices, instruments, optical devices, etc., can solve the problems of long calculation time and insufficiency, difficulty in obtaining effective local features, and low rough registration accuracy. The effect of ideal flatness measurement results and improved registration accuracy

Active Publication Date: 2021-10-19
CHINA JILIANG UNIV
View PDF9 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The main problem faced in the point cloud registration of flatness measurement is: due to the large number of point clouds obtained by the laser profiler, the classic Iterative Closest Point (ICP) algorithm cannot meet the actual requirements due to its long calculation time. needs
On the other hand, in order to ensure that the point cloud registration does not fall into the local optimal solution, the point cloud registration method of first coarse registration and then fine registration is often used. In the rough registration based on feature descriptors, due to the lack of planar point cloud Texture makes it difficult to obtain effective local features, resulting in low accuracy of coarse registration, which has an adverse effect on subsequent fine registration

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Point cloud registration strategy in flatness measurement of laser contourgraph
  • Point cloud registration strategy in flatness measurement of laser contourgraph
  • Point cloud registration strategy in flatness measurement of laser contourgraph

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0071] Such as figure 1 As shown, the point cloud registration strategy in laser profiler flatness measurement includes template sampling point setting steps, template boundary point cloud calculation steps, boundary point cloud calculation steps to be measured, point cloud rough matching steps, and pose transformation calculation steps steps and flatness calculation steps;

[0072] Such as figure 2 As shown, the template sampling point setting step obtains a point cloud of an object to be measured as a template point cloud, and sets sampling points in the template point cloud;

[0073] In the template boundary point cloud calculation step, the template point cloud is used as the original point cloud input point cloud boundary extraction algorithm, and the output boundary point cloud is used as the template boundary point cloud;

[0074] The step of calculating the boundary point cloud to be measured is to obtain the point cloud information of the object to be measured as t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a point cloud registration strategy in flatness measurement of a laser contourgraph, and solves the problem of rapid and accurate estimation of a point cloud pose of an object to be measured in the flatness measurement of the laser contourgraph. The method comprises the following steps: firstly, extracting a boundary of a point cloud through an algorithm to obtain a more effective key point SHOT feature descriptor, and eliminating invalid key points through key point neighborhood evaluation to obtain a preliminary matching point pair; secondly, clustering the feature matching point pairs in combination with geometric consistency of the feature matching point pairs so as to realize coarse registration of the point clouds; and finally, completing fine registration of the point clouds by using an ICP algorithm based on the boundary point clouds. In comparison experiments with classical point cloud registration algorithms such as SHOT + ICP, 4PCS + ICP, NDT and the like, the speed and the precision of the method are improved to a certain extent.

Description

technical field [0001] The invention relates to the technical field of flatness measurement, in particular to a point cloud registration strategy in the flatness measurement of a laser profiler. Background technique [0002] With the development of machine vision technology worldwide, this technology is widely used in various aspects of industrial production inspection. As one of the important components of geometric tolerance, flatness has a wide range of testing requirements in many fields such as machinery, military industry and electronics. Traditional flatness measurement solutions are limited by various factors such as accuracy, detection speed, or equipment cost, and cannot meet the increasingly stringent detection requirements in actual production lines. In recent years, machine vision has been widely used in flatness detection. Among them, the laser profiler is very suitable for fast and high-precision flatness measurement because it can quickly and accurately obta...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/33G06T7/13G06K9/46G06K9/62G01B11/30
CPCG06T7/344G06T7/13G01B11/30G06T2207/10028
Inventor 曹松晓舒子超汤建斌徐志鹏蒋庆
Owner CHINA JILIANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products