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A long and short pin test fixture structure

A technology for testing fixtures and lengths, which is applied in the direction of measuring devices, measuring electrical variables, and measuring device casings, and can solve problems such as troublesome replacement and affecting detection work efficiency

Active Publication Date: 2022-05-13
深圳市国天电子股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a long and short PIN test fixture structure to solve the problem that the replacement is very troublesome and affects the detection work efficiency in the above-mentioned background technology

Method used

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  • A long and short pin test fixture structure
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  • A long and short pin test fixture structure

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Embodiment Construction

[0025] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0026] see Figure 1 to Figure 6 , the present invention provides a technical solution:

[0027] A long and short PIN test jig structure, comprising a jig body 1, a moving slot 11 is provided in the middle of the jig body 1, a moving device is installed in the moving slot 11 and the moving device includes a first moving frame 3 and a second moving frame. The frame 4 , the first mobile frame 3 and the second mobile frame 4 are relatively installed in the mobil...

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Abstract

The present invention relates to the technical field of long and short PIN testing, and specifically relates to a long and short PIN testing jig structure, including a jig body, a moving slot is opened in the middle of the jig body, and a moving device is installed in the moving slot. A positioning and clamping device is installed on the moving device, and a motor slot is opened on one side of the jig body, and a shaft hole is opened at the front end of the motor slot, and the shaft hole penetrates into the moving slot, and the two positioning clamps are clamped. In the process of separating the blocks from each other, the rotation of the positioning and clamping blocks can be realized, that is, the conversion of the cylindrical connector and the square connector positioning fixture can be realized, and the positioning of the square connector and the cylindrical connector can be realized without replacing the positioning fixture Clamping greatly improves the efficiency of detection and improves the practicability of the test fixture.

Description

technical field [0001] The invention relates to the technical field of long and short PIN testing, in particular to a long and short PIN testing jig structure. Background technique [0002] Connectors generally contain multiple parallel metal contacts (PIN pins) of equal length. During production, due to processing errors or inaccurate assembly, the lengths of the metal contacts of the connector are inconsistent, resulting in poor contact and signal failure after use. Instability, in order to ensure the quality of electrical appliances assembled by downstream manufacturers, it is necessary to detect the length of the metal contact pins of the connector and reject the defective products. However, the efficiency of manual removal is low, and testing fixtures are generally used for testing. There are certain disadvantages in the process of using the test fixture under the technology. When the fixture is used to clamp the connector, it often cannot achieve accurate positioning, ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/04
CPCG01R1/0425
Inventor 陈韬黎桂新林锦夏肖玲莉
Owner 深圳市国天电子股份有限公司