A long and short pin test fixture structure
A technology for testing fixtures and lengths, which is applied in the direction of measuring devices, measuring electrical variables, and measuring device casings, and can solve problems such as troublesome replacement and affecting detection work efficiency
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[0025] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0026] see Figure 1 to Figure 6 , the present invention provides a technical solution:
[0027] A long and short PIN test jig structure, comprising a jig body 1, a moving slot 11 is provided in the middle of the jig body 1, a moving device is installed in the moving slot 11 and the moving device includes a first moving frame 3 and a second moving frame. The frame 4 , the first mobile frame 3 and the second mobile frame 4 are relatively installed in the mobil...
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