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Calibration method and device of structured light measurement system and electronic equipment

A technology of measurement system and calibration method, which is applied to measurement devices, optical devices, instruments, etc., can solve the problem of difficulty in directly determining the mapping relationship between the depth and phase of a structured light measurement system.

Pending Publication Date: 2021-10-29
苏州小优智能科技有限公司
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  • Application Information

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Problems solved by technology

[0004] However, the existing calibration methods are mainly to calibrate the parameters required to solve the three-dimensional coordinates of the point based on the pixel coordinates of any point on the image and the phase of the point, and it is difficult to directly determine the mapping relationship between the depth and the phase of the structured light measurement system

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  • Calibration method and device of structured light measurement system and electronic equipment
  • Calibration method and device of structured light measurement system and electronic equipment
  • Calibration method and device of structured light measurement system and electronic equipment

Examples

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example 1

[0061] Example 1, when the white base plate is in the first pose, take a target image, remove the transparent calibration plate with the black circular target, keep the pose of the white base plate unchanged, and use the DLP laser projector to The white base plate projects two sets of sinusoidal fringe sequences of different frequencies, takes two fringe images of different frequencies, adjusts the position and posture of the white base plate, repeats the shooting 14 times, and finally obtains 15 sets of calibration images, and each set of calibration images includes a target image and two fringe images of different frequencies in the same pose, the poses of each group of calibration images are different.

[0062] S2. Use the target images in the multiple sets of calibration images to calibrate the industrial camera to obtain camera internal parameters, camera distortion coefficients and multiple sets of external parameters.

[0063] Among them, the internal parameters of the ...

example 2

[0066] Example 2. On the basis of the previous example 1, use the Zhang Zhengyou calibration method to calibrate the industrial camera according to the target images in 15 sets of calibration images to obtain the camera internal parameter matrix 15 groups of rotation matrices and translation matrix 5 distortion coefficients k 1 、k 2 、k 3 ,p 1 ,p 2 .

[0067] S3. Obtain the pixel coordinates of multiple target points from each set of calibration images, and calculate the absolute phase values ​​of the multiple target point positions of each set of calibration images according to the fringe images in each set of calibration images.

[0068] In this embodiment, multiple target points are selected in the target images in each group of calibration images, and the pixel coordinates of multiple target points are recorded to calculate the depth values ​​of multiple target points. Since the target points in the same group of calibration images The poses of the image and the ...

example 3

[0070] Example 3, on the basis of the previous example 2, select 6 target points from the target images in each group of calibration images, first use the four-step phase shift formula to solve the phase, and use the following formulas 1 to 3 to calculate based on two fringe images The main phase value θ(x, y) of the six target point positions, where I'(x, y) is the average gray level of the image, and I"(x, y) is the gray level modulation of the image.

[0071]

[0072] Formula 2 can be obtained from formula 1:

[0073]

[0074] Formula 3 can be obtained from formula 2:

[0075]

[0076] According to the main phase value θ(x, y) of the six target point positions of each group of calibration images, the unwrapping is performed by the principle of multi-frequency heterodyne, and the absolute phase values ​​​​of the six target point positions are calculated by the following formulas 4 and 5 where f H , f L are θ H (x,y), θ L The frequency corresponding to (x,y). ...

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Abstract

The invention provides a calibration method and device for a structured light measurement system and electronic equipment. The calibration method comprises the following steps: acquiring a target image and a stripe image by using an industrial camera; calibrating the industrial camera by using the target image to obtain internal parameters, distortion coefficients and external parameters of the camera; obtaining pixel coordinates of a plurality of target points from the target image, and calculating absolute phase values of the positions of the target points according to the corresponding stripe images; calculating according to the internal parameters, the distortion coefficient and the external parameters of the camera and the pixel coordinates of the plurality of target points to obtain depth values of the positions of the plurality of target points; and fitting a pre-constructed phase and depth mapping relation polynomial function according to the absolute phase values and the depth values of the multiple target point positions to obtain fitting parameters of the phase and depth mapping relation. According to the scheme, fitting of the mapping relation between the depth and the phase of the structured light measurement system is achieved in a polynomial fitting mode, and therefore the depth information of any point on an object is calculated according to the phase information of the point.

Description

technical field [0001] The present invention relates to the technical field of structured light measurement, in particular to a calibration method, device and electronic equipment for a structured light measurement system. Background technique [0002] With the development of science and technology, various advanced measurement technologies have become research hotspots. The structured light measurement system has the advantages of non-contact, fast measurement speed, high measurement accuracy and low cost, and has been widely used in various fields. [0003] The structured light measurement system is a system that uses a specific light source to irradiate the target to form artificial features, and the camera collects these features for measurement. For the three-dimensional information at any point, the calibration accuracy of the structured light measurement system plays a decisive role in the measurement accuracy of the system. [0004] However, the existing calibration...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00G01B11/22
CPCG01B21/042G01B11/00G01B11/22
Inventor 杨建滨李虹周印伟杜先鹏金传广
Owner 苏州小优智能科技有限公司
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