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Variable frequency data acquisition method and device

A technology of data acquisition and frequency conversion, which is used in measuring devices, measuring electrical variables, instruments, etc., can solve the problems that data acquisition can not meet the performance well and reduce the amount of data.

Pending Publication Date: 2021-11-02
杭州中安电子有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] The present invention provides a method and device for variable frequency data collection aiming at the shortcomings of the method that data collection cannot satisfy the performance well while greatly reducing the amount of data at the same time

Method used

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  • Variable frequency data acquisition method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0041] A method of varying frequency data acquisition, its method includes

[0042] S1, the setting of the sampling interval, the controller is based on the acquisition temperature sensitive parameter VCE, the sampling frequency p sample / s, each sample number q sample / time; and q / p = 0.1s; the acquisition section is [0,100], Sampling interval segmentation;

[0043] S2, the number of sample points, the number of sample points per segment of the sampling section after S1 is m;

[0044]S3, the number of acquisitions, the number of controls per acquisition is j; when the controller is collected, the acquisition is incremented by sequentially, and j = 100 * q / p;

[0045] S4, collect the determination of array, based on sensitive parameters Y q-1 Time t collection q-1 , Get the acquisition array a; where A = [(Y 0 , T 0 ), (Y 1 , T 1 ), (Y 2 , T 2 ), ..., (Y q-1 , T q-1 ); And transform array A for new arrays.

[0046] The segmentation frequency processing of the entire transien...

Embodiment 2

[0065] On the basis of Example 1, a device for converting frequency data acquisition is implemented by a modified frequency data acquisition method.

Embodiment 3

[0067] On the basis of Example 1, when polymerization n Perform average, corresponding T n It also needs to be averaged, and the polymerization makes up new points (T n Y n ), In this time period [10 -4 10 -3 】 1 point according to I = 9 points, so that the array A3 includes 100 points, time period [10 -3 10 -2 The 1 point is synthesized according to I = 90 points, so that array A4 includes 100 points, time period [10 -2 10 -1 The 1 point is synthesized according to I = 900 points, so that the array A5 contains 100 points so that the data points in the above 3 segment are desired to the desired point.

[0068] The count group B [(T0, Y0), ..., (Tn, YN)] is the set of data points converted by array A, and the data subsets A1, A2, A3, A4 of each time period change or has not changed. , A5 is converted into B1, B2, B3, B4, B5, and re-according to the time order into a new array B [(T0, Y0), ..., (Tn, Y)], the value B contains 400 points;

[0069] When 1 -1 10 0 ], Calculation paramet...

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Abstract

The invention relates to a variable-frequency data acquisition technology and discloses a variable-frequency data acquisition method and device. The method comprises steps of setting a sampling interval, and enabling q / p to be equal to 0.1s; the acquisition interval being [0, 100], and segmenting the sampling interval; setting the number of sampling points, wherein the number of the sampling points in each segment of the segmented sampling interval in S1 is m; determining the number of collection times, wherein the number of collection times of each time of the controller is j; after the controller performs acquisition, the acquisition being gradually increased in sequence; determining an acquisition array, and obtaining the acquisition array A according to the sensitive parameter yq-1 and the acquisition moment tq-1; and converting the array A to obtain a new array. The method is advantaged in that characteristics of thermal resistance testing are utilized, the change is fast and the sampling rate is high within a short time in the early stage, the change is slow and the sampling rate is low in the later stage, and the whole transient cooling curve is subjected to segmented variable frequency processing; the method meets the acquisition performance, guarantees accuracy of thermal resistance calculation, reduces the data volume, and enables software operation to be smoother and more reliable.

Description

Technical field [0001] The present invention relates to variable frequency data acquisition techniques, which disclose a method and apparatus for a variable frequency data acquisition for a semiconductor device housing thermal resistance. Background technique [0002] The semiconductor device housing thermal resistance is one of the most important thermal parameters of the semiconductor, and is a parameter that measures the thermal diffusion capability of the semiconductor device from the chip to the package surface. [0003] At present, the international mainstream test thermal resistance method is a transient dual interface method, even if the surface of the device housing is in contact with the external ideal heat sink, first heating the device, then quickly cut off large current, and collect the temperature sensitive parameters (TSP) The time change curve, finally calculates the thermal resistance curve to obtain a transient cooling curve. Change the contact thermal resistanc...

Claims

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Application Information

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IPC IPC(8): G01R31/26
CPCG01R31/2601
Inventor 胡世松柴俊标卜建明
Owner 杭州中安电子有限公司